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Zevin, L. S. (1979) Methods of mixing in quantitative X-ray phase analysis. Journal of Applied Crystallography, 12 (6) 582-584 doi:10.1107/s0021889879013285

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Reference TypeJournal (article/letter/editorial)
TitleMethods of mixing in quantitative X-ray phase analysis
JournalJournal of Applied Crystallography
AuthorsZevin, L. S.Author
Year1979 (December 1)Volume12
Issue6
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889879013285Search in ResearchGate
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Mindat Ref. ID467728Long-form Identifiermindat:1:5:467728:8
GUID0
Full ReferenceZevin, L. S. (1979) Methods of mixing in quantitative X-ray phase analysis. Journal of Applied Crystallography, 12 (6) 582-584 doi:10.1107/s0021889879013285
Plain TextZevin, L. S. (1979) Methods of mixing in quantitative X-ray phase analysis. Journal of Applied Crystallography, 12 (6) 582-584 doi:10.1107/s0021889879013285
In(1979, December) Journal of Applied Crystallography Vol. 12 (6) International Union of Crystallography (IUCr)

See Also

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Łukaszewicz, K. (1976) Quantitative X-ray phase analysisby L. S. Zevin and L. L. Zavyalova. Journal of Applied Crystallography, 9 (6) 513-514 doi:10.1107/s002188987601217x
Zevin, L. S., Rozenak, P., Eliezer, D. (1984) Quantitative X-ray phase analysis of surface layers. Journal of Applied Crystallography, 17 (1) 18-21 doi:10.1107/s0021889884010931
Zevin, L. S., Shneck, R., Zevin, I. M. (1981) Quantitative X-ray phase analysis without standards: general case of overcapping peaks. Acta Crystallographica Section A Foundations of Crystallography, 37. doi:10.1107/s0108767381091319
Zevin, L. S. (1977) A method of quantitative phase analysis without standards. Journal of Applied Crystallography, 10 (3) 147-150 doi:10.1107/s0021889877013144
Popović, S., Gržeta-Plenković, B. (1979) The doping method in quantitative X-ray diffraction phase analysis. Journal of Applied Crystallography, 12 (2) 205-208 doi:10.1107/s0021889879012188
Majumdar, A. J., Vallance, L. S., Born, C. G. G. (1972) Quantitative analysis of phase composition using X-ray diffraction methods. Journal of Applied Crystallography, 5 (5) 343-347 doi:10.1107/s0021889872009732
Valvoda, V. (1987) Correction of integrated X-ray intensities for preferred orientation in quantitative phase analysis. Journal of Applied Crystallography, 20 (6). 453-456 doi:10.1107/s0021889887086229
Zevin, L. S., Zevin, I. M. (1987) X-ray diffractometry of low-mass samples. Acta Crystallographica Section A Foundations of Crystallography, 43. doi:10.1107/s0108767387078140
Zevin, L. S., Melamed, Z. (1985) X-ray diffraction by cathodically charged austenitic stainless steel. Journal of Applied Crystallography, 18 (5) 267-271 doi:10.1107/s0021889885010317
Weiss, Z., Krajíček, J., Smrčok, L., Fiala, J. (1983) A computer X-ray quantitative phase analysis. Journal of Applied Crystallography, 16 (5) 493-497 doi:10.1107/s0021889883010882
Cong, Q. (1992) Phase analysis of bulk samples using sample-tilting X-ray diffractometry. Journal of Applied Crystallography, 25 (5). 582-588 doi:10.1107/s0021889892004412
 
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