| Reference Type | Journal (article/letter/editorial) |
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| Title | Quantitative analysis of phase composition using X-ray diffraction methods |
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| Journal | Journal of Applied Crystallography |
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| Authors | Majumdar, A. J. | Author |
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| Vallance, L. S. | Author |
| Born, C. G. G. | Author |
| Year | 1972 (October 1) | Volume | 5 |
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| Issue | 5 |
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| Publisher | International Union of Crystallography (IUCr) |
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| DOI | doi:10.1107/s0021889872009732Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 463576 | Long-form Identifier | mindat:1:5:463576:9 |
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| GUID | 0 |
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| Full Reference | Majumdar, A. J., Vallance, L. S., Born, C. G. G. (1972) Quantitative analysis of phase composition using X-ray diffraction methods. Journal of Applied Crystallography, 5 (5) 343-347 doi:10.1107/s0021889872009732 |
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| Plain Text | Majumdar, A. J., Vallance, L. S., Born, C. G. G. (1972) Quantitative analysis of phase composition using X-ray diffraction methods. Journal of Applied Crystallography, 5 (5) 343-347 doi:10.1107/s0021889872009732 |
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| In | (1972, October) Journal of Applied Crystallography Vol. 5 (5) International Union of Crystallography (IUCr) |
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