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Wilson, A. J. C. (1972) Comments on the application of variance analysis to the X-ray diffraction of polymers. Journal of Applied Crystallography, 5 (4) 301-302 doi:10.1107/s0021889872009562

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Reference TypeJournal (article/letter/editorial)
TitleComments on the application of variance analysis to the X-ray diffraction of polymers
JournalJournal of Applied Crystallography
AuthorsWilson, A. J. C.Author
Year1972 (August 1)Volume5
Issue4
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889872009562Search in ResearchGate
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Mindat Ref. ID463516Long-form Identifiermindat:1:5:463516:5
GUID0
Full ReferenceWilson, A. J. C. (1972) Comments on the application of variance analysis to the X-ray diffraction of polymers. Journal of Applied Crystallography, 5 (4) 301-302 doi:10.1107/s0021889872009562
Plain TextWilson, A. J. C. (1972) Comments on the application of variance analysis to the X-ray diffraction of polymers. Journal of Applied Crystallography, 5 (4) 301-302 doi:10.1107/s0021889872009562
In(1972, August) Journal of Applied Crystallography Vol. 5 (4) International Union of Crystallography (IUCr)

See Also

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Viswanathan, A. (1972) On the application of Wilson's variance–range analysis to polymeric X-ray diffraction profiles. Journal of Applied Crystallography, 5 (4) 300 doi:10.1107/s0021889872009550
Cheary, R. W., Grimes, N. W. (1972) The application of truncated integrated intensity to the analysis of broadened X-ray diffraction lines. Journal of Applied Crystallography, 5 (2) 57-63 doi:10.1107/s0021889872008775
Kulshreshitha, A. K., Dweltz, N. E., Radhakrishnan, T. (1971) Analysis of polymeric X-ray diffraction profiles. I. Theory and application of the variance method. Journal of Applied Crystallography, 4 (2) 116-125 doi:10.1107/s0021889871006460
Majumdar, A. J., Vallance, L. S., Born, C. G. G. (1972) Quantitative analysis of phase composition using X-ray diffraction methods. Journal of Applied Crystallography, 5 (5) 343-347 doi:10.1107/s0021889872009732
Langford, J. I., Tapia, J. (1974) X-ray diffraction studies of thin gold films using the variance method. Journal of Applied Crystallography, 7 (4) 421-426 doi:10.1107/s0021889874010053
Hilleard, R. J., Webster, J. A. (1969) A program to calculate the variance of X-ray line profiles. Journal of Applied Crystallography, 2 (5) 193-196 doi:10.1107/s0021889869006960
Liao, B., Chen, J. (1992) The application of cluster analysis in X-ray diffraction phase analysis. Journal of Applied Crystallography, 25 (3). 336-339 doi:10.1107/s0021889891012372
Faloci, C., Susanna, A., Zampini, F. (1972) Radiation hazards from X-ray diffraction equipment. Journal of Applied Crystallography, 5 (5) 375-376 doi:10.1107/s0021889872009811
Rabiej, Małgorzata (2017) Application of the particle swarm optimization method for the analysis of wide-angle X-ray diffraction curves of semicrystalline polymers. Journal of Applied Crystallography, 50 (1). 221-230 doi:10.1107/s160057671601983x
Szabó, P. (1982) Addenda to the optimization of quantitative X-ray diffraction analysis. Journal of Applied Crystallography, 15 (4) 449-451 doi:10.1107/s0021889882012345
Vasudevan, R. (1970) Application of Fourier analysis to the X-ray diffraction pattern of filings of a face-centred cubic copper–silicon–manganese alloy. Journal of Applied Crystallography, 3 (4) 211-213 doi:10.1107/s0021889870006064
 
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