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Cheary, R. W., Grimes, N. W. (1972) The application of truncated integrated intensity to the analysis of broadened X-ray diffraction lines. Journal of Applied Crystallography, 5 (2) 57-63 doi:10.1107/s0021889872008775

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Reference TypeJournal (article/letter/editorial)
TitleThe application of truncated integrated intensity to the analysis of broadened X-ray diffraction lines
JournalJournal of Applied Crystallography
AuthorsCheary, R. W.Author
Grimes, N. W.Author
Year1972 (April 1)Volume5
Issue2
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889872008775Search in ResearchGate
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Mindat Ref. ID463268Long-form Identifiermindat:1:5:463268:3
GUID0
Full ReferenceCheary, R. W., Grimes, N. W. (1972) The application of truncated integrated intensity to the analysis of broadened X-ray diffraction lines. Journal of Applied Crystallography, 5 (2) 57-63 doi:10.1107/s0021889872008775
Plain TextCheary, R. W., Grimes, N. W. (1972) The application of truncated integrated intensity to the analysis of broadened X-ray diffraction lines. Journal of Applied Crystallography, 5 (2) 57-63 doi:10.1107/s0021889872008775
In(1972, April) Journal of Applied Crystallography Vol. 5 (2) International Union of Crystallography (IUCr)

See Also

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Cheary, R. W., Grimes, N. W. (1978) Investigation of antiphase domains in lithium ferrite by analysis of the broadened X-ray lines. Acta Crystallographica Section A, 34 (1) 74-84 doi:10.1107/s0567739478000145
Cheary, R. W., Grimes, N. W. (1972) X-ray diffraction from materials containing antiphase domains. Acta Crystallographica Section A, 28 (5) 454-458 doi:10.1107/s0567739472001172
Cheary, R. W., Grimes, N. W. (1979) An X-ray diffraction investigation of chromium-substituted lithium ferrite. Acta Crystallographica Section A, 35 (4) 665-672 doi:10.1107/s0567739479001534
Cheary, R. W., Dooryhee, E., Lynch, P., Armstrong, N., Dligatch, S. (2000) X-ray diffraction line broadening from thermally deposited gold films. Journal of Applied Crystallography, 33 (5). 1271-1283 doi:10.1107/s0021889800009936
Grimes, N. W., Pearson, J. M., Fane, R. W., Neal, W. E. J. (1970) A variance analysis of broadened X-ray diffraction lines from evaporated thin films of aluminium. Philosophical Magazine, 21 (169). 177-187 doi:10.1080/14786437008238405
Viswanathan, A. (1972) On the application of Wilson's variance–range analysis to polymeric X-ray diffraction profiles. Journal of Applied Crystallography, 5 (4) 300 doi:10.1107/s0021889872009550
Cheary, R. W., Coelho, A. (1992) A fundamental parameters approach to X-ray line-profile fitting. Journal of Applied Crystallography, 25 (2). 109-121 doi:10.1107/s0021889891010804
Wilson, A. J. C. (1972) Comments on the application of variance analysis to the X-ray diffraction of polymers. Journal of Applied Crystallography, 5 (4) 301-302 doi:10.1107/s0021889872009562
Hendricks, R. W. (1972) A unified theory of absolute intensity measurements in small-angle X-ray scattering. Journal of Applied Crystallography, 5 (5) 315-324 doi:10.1107/s0021889872009690
Tang, C. C., Lynch, P. A., Cheary, R. W., Clark, S. M. (2007) Anin situmethod for the study of strain broadening using synchrotron X-ray diffraction. Journal of Applied Crystallography, 40 (4). 642-649 doi:10.1107/s0021889807016299
Matthews, F. W. (1972) Interpretation of X-ray powder diffraction patternsby H. Lipson and H. Steeple. Journal of Applied Crystallography, 5 (2) 146-147 doi:10.1107/s0021889872009082
 
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