| Reference Type | Journal (article/letter/editorial) |
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| Title | Quantitative X-ray phase analysis of surface layers |
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| Journal | Journal of Applied Crystallography |
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| Authors | Zevin, L. S. | Author |
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| Rozenak, P. | Author |
| Eliezer, D. | Author |
| Year | 1984 (February 1) | Volume | 17 |
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| Issue | 1 |
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| Publisher | International Union of Crystallography (IUCr) |
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| DOI | doi:10.1107/s0021889884010931Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 469773 | Long-form Identifier | mindat:1:5:469773:6 |
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| GUID | 0 |
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| Full Reference | Zevin, L. S., Rozenak, P., Eliezer, D. (1984) Quantitative X-ray phase analysis of surface layers. Journal of Applied Crystallography, 17 (1) 18-21 doi:10.1107/s0021889884010931 |
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| Plain Text | Zevin, L. S., Rozenak, P., Eliezer, D. (1984) Quantitative X-ray phase analysis of surface layers. Journal of Applied Crystallography, 17 (1) 18-21 doi:10.1107/s0021889884010931 |
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| In | (1984, February) Journal of Applied Crystallography Vol. 17 (1) International Union of Crystallography (IUCr) |
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