| Reference Type | Journal (article/letter/editorial) |
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| Title | Development and application of a combined atomic force microscopy-nanoindentation system with a silicon tip and a diamond indenter |
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| Journal | Philosophical Magazine A |
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| Authors | Miyahara, K. | Author |
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| Nagashima, N. | Author |
| Matsuoka, S. | Author |
| Year | 2002 (July 1) | Volume | 82 |
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| Issue | 10 |
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| Publisher | Informa UK Limited |
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| DOI | doi:10.1080/01418610210134459Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 17112222 | Long-form Identifier | mindat:1:5:17112222:2 |
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|
| GUID | 0 |
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| Full Reference | Miyahara, K., Nagashima, N., Matsuoka, S. (2002) Development and application of a combined atomic force microscopy-nanoindentation system with a silicon tip and a diamond indenter. Philosophical Magazine A, 82 (10) 2149-2160 doi:10.1080/01418610210134459 |
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| Plain Text | Miyahara, K., Nagashima, N., Matsuoka, S. (2002) Development and application of a combined atomic force microscopy-nanoindentation system with a silicon tip and a diamond indenter. Philosophical Magazine A, 82 (10) 2149-2160 doi:10.1080/01418610210134459 |
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| In | (2002, July) Philosophical Magazine A Vol. 82 (10) Informa UK Limited |
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