| Reference Type | Journal (article/letter/editorial) |
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| Title | Crack tip dislocations in silicon characterized by high-voltage electron microscopy |
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| Journal | Philosophical Magazine A |
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| Authors | Higashida, K. | Author |
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| Narita, N. | Author |
| Tanaka, M. | Author |
| Morikawa, T. | Author |
| Miura, Y. | Author |
| Onodera, R. | Author |
| Year | 2002 (November) | Volume | 82 |
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| Issue | 17 |
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| Publisher | Informa UK Limited |
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| DOI | doi:10.1080/01418610208240439Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 11355283 | Long-form Identifier | mindat:1:5:11355283:4 |
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|
| GUID | 0 |
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| Full Reference | Higashida, K., Narita, N., Tanaka, M., Morikawa, T., Miura, Y., Onodera, R. (2002) Crack tip dislocations in silicon characterized by high-voltage electron microscopy. Philosophical Magazine A, 82 (17). 3263-3273 doi:10.1080/01418610208240439 |
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| Plain Text | Higashida, K., Narita, N., Tanaka, M., Morikawa, T., Miura, Y., Onodera, R. (2002) Crack tip dislocations in silicon characterized by high-voltage electron microscopy. Philosophical Magazine A, 82 (17). 3263-3273 doi:10.1080/01418610208240439 |
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| In | (2002, November) Philosophical Magazine A Vol. 82 (17) Informa UK Limited |
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