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Göken, M., Thome, F., Vehoff, H. (2002) Study of crack tip deformation in FeAl and NiAl crystals with optical interference microscopy and atomic force microscopy. Philosophical Magazine A, 82 (17). 3241-3250 doi:10.1080/0141861021000024424

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Reference TypeJournal (article/letter/editorial)
TitleStudy of crack tip deformation in FeAl and NiAl crystals with optical interference microscopy and atomic force microscopy
JournalPhilosophical Magazine A
AuthorsGöken, M.Author
Thome, F.Author
Vehoff, H.Author
Year2002 (November 20)Volume82
Issue17
PublisherInforma UK Limited
DOIdoi:10.1080/0141861021000024424Search in ResearchGate
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Mindat Ref. ID11355302Long-form Identifiermindat:1:5:11355302:2
GUID0
Full ReferenceGöken, M., Thome, F., Vehoff, H. (2002) Study of crack tip deformation in FeAl and NiAl crystals with optical interference microscopy and atomic force microscopy. Philosophical Magazine A, 82 (17). 3241-3250 doi:10.1080/0141861021000024424
Plain TextGöken, M., Thome, F., Vehoff, H. (2002) Study of crack tip deformation in FeAl and NiAl crystals with optical interference microscopy and atomic force microscopy. Philosophical Magazine A, 82 (17). 3241-3250 doi:10.1080/0141861021000024424
In(2002, November) Philosophical Magazine A Vol. 82 (17) Informa UK Limited

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Göken, M., Thome, F., Vehoff, H. (2002) Study of crack tip deformation in FeAl and NiAl crystals with optical interference microscopy and atomic force microscopy. Philosophical Magazine A, 82 (17). 3241-3250 doi:10.1080/01418610208240437
Göken, M., Vehoff, H., Neumann, P. (1995) Investigations of loaded crack tips in NiAl by atomic force microscopy. Scripta Metallurgica et Materialia, 33 (7). 1187-1192 doi:10.1016/0956-716x(95)00347-x
Thome, F., Göken, M., Vehoff, H. (1999) Study of the fracture behavior in soft and hard oriented NiAl single crystals by AFM. Intermetallics, 7 (3). 491-499 doi:10.1016/s0966-9795(98)00120-4
Kempf, M., Göken, M., Vehoff, H. (2002) The mechanical properties of different lamellae and domains in PST-TiAl investigated with nanoindentations and atomic force microscopy. Materials Science and Engineering: A, 329. 184-189 doi:10.1016/s0921-5093(01)01561-1
Miyahara, K., Nagashima, N., Matsuoka, S. (2002) Development and application of a combined atomic force microscopy-nanoindentation system with a silicon tip and a diamond indenter. Philosophical Magazine A, 82 (10). 2149-2160 doi:10.1080/01418610208235724
Miyahara, K., Nagashima, N., Matsuoka, S. (2002) Development and application of a combined atomic force microscopy-nanoindentation system with a silicon tip and a diamond indenter. Philosophical Magazine A, 82 (10) 2149-2160 doi:10.1080/01418610210134459
Higashida, K., Narita, N., Tanaka, M., Morikawa, T., Miura, Y., Onodera, R. (2002) Crack tip dislocations in silicon characterized by highvoltage electron microscopy. Philosophical Magazine A, 82 (17). 3263-3273 doi:10.1080/01418610210141307
Higashida, K., Narita, N., Tanaka, M., Morikawa, T., Miura, Y., Onodera, R. (2002) Crack tip dislocations in silicon characterized by high-voltage electron microscopy. Philosophical Magazine A, 82 (17). 3263-3273 doi:10.1080/01418610208240439
Vehoff, H., Ochmann, P., Göken, M., Große Gehling, M. (1997) Deformation processes at crack tips in NiAl single- and bicrystals. Materials Science and Engineering: A, 239. 378-385 doi:10.1016/s0921-5093(97)00606-0
Iqbal, F., Pyczak, F., Neumeier, S., Göken, M. (2017) Crack nucleation and elastic / plastic deformation of TiAl alloys investigated by in-situ loaded atomic force microscopy. Materials Science and Engineering: A, 689. 11-16 doi:10.1016/j.msea.2017.02.017
Fruhstorfer, B., Mohles, V., Reichelt, R., Nembach, E. (2002) Quantitative characterization of second-phase particles by atomic force microscopy and scanning electron microscopy. Philosophical Magazine A, 82 (13). 2575-2589 doi:10.1080/01418610208240053
 
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