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Hartmaier, Alexander, Gumbsch, Peter (2002) Scaling relations for crack-tip plasticity. Philosophical Magazine A, 82 (17). 3187-3200 doi:10.1080/01418610208240432

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Reference TypeJournal (article/letter/editorial)
TitleScaling relations for crack-tip plasticity
JournalPhilosophical Magazine A
AuthorsHartmaier, AlexanderAuthor
Gumbsch, PeterAuthor
Year2002 (November)Volume82
Issue17
PublisherInforma UK Limited
DOIdoi:10.1080/01418610208240432Search in ResearchGate
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Mindat Ref. ID11355276Long-form Identifiermindat:1:5:11355276:6
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Full ReferenceHartmaier, Alexander, Gumbsch, Peter (2002) Scaling relations for crack-tip plasticity. Philosophical Magazine A, 82 (17). 3187-3200 doi:10.1080/01418610208240432
Plain TextHartmaier, Alexander, Gumbsch, Peter (2002) Scaling relations for crack-tip plasticity. Philosophical Magazine A, 82 (17). 3187-3200 doi:10.1080/01418610208240432
In(2002, November) Philosophical Magazine A Vol. 82 (17) Informa UK Limited

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Hartmaier, Alexander, Gumbsch, Peter (2002) Scaling relations for crack-tip plasticity. Philosophical Magazine A, 82 (17) 3187-3200 doi:10.1080/0141861021000018160
Hartmaier, Alexander, Gumbsch, Peter (2005) Thermal activation of crack-tip plasticity: The brittle or ductile response of a stationary crack loaded to failure. Physical Review B, 71 (2) doi:10.1103/physrevb.71.024108
Sadananda, K., Ramaswamy, D.N. V. (2001) Role of crack tip plasticity in fatigue crack growth. Philosophical Magazine A, 81 (5). 1283-1303 doi:10.1080/01418610108214441
Ramaswamy, K. Sadanandaa, Dorai-Nirmal V. (2001) Role of crack tip plasticity in fatigue crack growth. Philosophical Magazine A, 81 (5). 1283-1303 doi:10.1080/01418610110033876
Higashida, K., Narita, N., Tanaka, M., Morikawa, T., Miura, Y., Onodera, R. (2002) Crack tip dislocations in silicon characterized by highvoltage electron microscopy. Philosophical Magazine A, 82 (17). 3263-3273 doi:10.1080/01418610210141307
Pippan, R., Riemelmoser, F. O., Weinhandl, H., Kreuzer, H. (2002) Plasticity-induced crack closure under plane-strain conditions in the near-threshold regime. Philosophical Magazine A, 82 (17). 3299-3309 doi:10.1080/01418610208240442
Pippan, R., Riemelmoser, F. O., Weinhandl, H., Kreuzer, H. (2002) Plasticity-induced crack closure under plane-strain conditions in the near-threshold regime. Philosophical Magazine A, 82 (17) 3299-3309 doi:10.1080/01418610210141316
Hassan, Hamad ul, Govind, Kishan, Hartmaier, Alexander (2019) Micromechanical modelling of coupled crystal plasticity and hydrogen diffusion. Philosophical Magazine, 99 (1). 92-115 doi:10.1080/14786435.2018.1530466
Higashida, K., Narita, N., Tanaka, M., Morikawa, T., Miura, Y., Onodera, R. (2002) Crack tip dislocations in silicon characterized by high-voltage electron microscopy. Philosophical Magazine A, 82 (17). 3263-3273 doi:10.1080/01418610208240439
Göken, M., Thome, F., Vehoff, H. (2002) Study of crack tip deformation in FeAl and NiAl crystals with optical interference microscopy and atomic force microscopy. Philosophical Magazine A, 82 (17). 3241-3250 doi:10.1080/01418610208240437
Göken, M., Thome, F., Vehoff, H. (2002) Study of crack tip deformation in FeAl and NiAl crystals with optical interference microscopy and atomic force microscopy. Philosophical Magazine A, 82 (17). 3241-3250 doi:10.1080/0141861021000024424
 
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