Frankel, P., Ding, Jian, Preuss, Michael, Byrne, Jim, Withers, Philip J. (2006) Residual Stress Analysis Around Foreign Object Damage Using Synchrotron Diffraction. Materials Science Forum, 524. 291-296 doi:10.4028/www.scientific.net/msf.524-525.291
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Residual Stress Analysis Around Foreign Object Damage Using Synchrotron Diffraction | ||
| Journal | Materials Science Forum | ||
| Authors | Frankel, P. | Author | |
| Ding, Jian | Author | ||
| Preuss, Michael | Author | ||
| Byrne, Jim | Author | ||
| Withers, Philip J. | Author | ||
| Year | 2006 (September) | Volume | 524 |
| Publisher | Trans Tech Publications, Ltd. | ||
| DOI | doi:10.4028/www.scientific.net/msf.524-525.291Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9861338 | Long-form Identifier | mindat:1:5:9861338:2 |
| GUID | 0 | ||
| Full Reference | Frankel, P., Ding, Jian, Preuss, Michael, Byrne, Jim, Withers, Philip J. (2006) Residual Stress Analysis Around Foreign Object Damage Using Synchrotron Diffraction. Materials Science Forum, 524. 291-296 doi:10.4028/www.scientific.net/msf.524-525.291 | ||
| Plain Text | Frankel, P., Ding, Jian, Preuss, Michael, Byrne, Jim, Withers, Philip J. (2006) Residual Stress Analysis Around Foreign Object Damage Using Synchrotron Diffraction. Materials Science Forum, 524. 291-296 doi:10.4028/www.scientific.net/msf.524-525.291 | ||
| In | (2006) Materials Science Forum Vol. 524. Trans Tech Publications, Ltd. | ||
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