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Steuwer, Axel, Peel, Matthew J., Buslaps, Thomas (2006) Aspects of Residual Stress Determination Using Energy-Dispersive Synchrotron X-Ray Diffraction. Materials Science Forum, 524. 267-272 doi:10.4028/www.scientific.net/msf.524-525.267

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Reference TypeJournal (article/letter/editorial)
TitleAspects of Residual Stress Determination Using Energy-Dispersive Synchrotron X-Ray Diffraction
JournalMaterials Science Forum
AuthorsSteuwer, AxelAuthor
Peel, Matthew J.Author
Buslaps, ThomasAuthor
Year2006 (September)Volume524
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/msf.524-525.267Search in ResearchGate
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Mindat Ref. ID9861334Long-form Identifiermindat:1:5:9861334:6
GUID0
Full ReferenceSteuwer, Axel, Peel, Matthew J., Buslaps, Thomas (2006) Aspects of Residual Stress Determination Using Energy-Dispersive Synchrotron X-Ray Diffraction. Materials Science Forum, 524. 267-272 doi:10.4028/www.scientific.net/msf.524-525.267
Plain TextSteuwer, Axel, Peel, Matthew J., Buslaps, Thomas (2006) Aspects of Residual Stress Determination Using Energy-Dispersive Synchrotron X-Ray Diffraction. Materials Science Forum, 524. 267-272 doi:10.4028/www.scientific.net/msf.524-525.267
In(2006) Materials Science Forum Vol. 524. Trans Tech Publications, Ltd.

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