| Reference Type | Journal (article/letter/editorial) |
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| Title | The Influence of Microstructure and Residual Stress on Pre-Yield Cracking in TiAl-Based Alloys |
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| Journal | Materials Science Forum |
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| Authors | Mota Solis, N. | Author |
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| Hu, D. | Author |
| Loretto, M.H. | Author |
| Voice, Wayne | Author |
| Preuss, Michael | Author |
| Withers, Philip J. | Author |
| Wu, Xin Hua | Author |
| Year | 2003 (August) | Volume | 426 |
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| Publisher | Trans Tech Publications, Ltd. |
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| DOI | doi:10.4028/www.scientific.net/msf.426-432.1655Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 9853564 | Long-form Identifier | mindat:1:5:9853564:0 |
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|
| GUID | 0 |
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| Full Reference | Mota Solis, N., Hu, D., Loretto, M.H., Voice, Wayne, Preuss, Michael, Withers, Philip J., Wu, Xin Hua (2003) The Influence of Microstructure and Residual Stress on Pre-Yield Cracking in TiAl-Based Alloys. Materials Science Forum, 426. 1655-1660 doi:10.4028/www.scientific.net/msf.426-432.1655 |
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| Plain Text | Mota Solis, N., Hu, D., Loretto, M.H., Voice, Wayne, Preuss, Michael, Withers, Philip J., Wu, Xin Hua (2003) The Influence of Microstructure and Residual Stress on Pre-Yield Cracking in TiAl-Based Alloys. Materials Science Forum, 426. 1655-1660 doi:10.4028/www.scientific.net/msf.426-432.1655 |
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| In | (2003) Materials Science Forum Vol. 426. Trans Tech Publications, Ltd. |
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