Nakashima, Shinichi, Nakatake, Yasuhiro, Ishida, Yuuki, Takahashi, Tetsuo, Okumura, Hajime (2002) Sensitive Detection of Defects in α and β SiC by Raman Scattering. Materials Science Forum, 389. 629-632 doi:10.4028/www.scientific.net/msf.389-393.629
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Sensitive Detection of Defects in α and β SiC by Raman Scattering | ||
| Journal | Materials Science Forum | ||
| Authors | Nakashima, Shinichi | Author | |
| Nakatake, Yasuhiro | Author | ||
| Ishida, Yuuki | Author | ||
| Takahashi, Tetsuo | Author | ||
| Okumura, Hajime | Author | ||
| Year | 2002 (April) | Volume | 389 |
| Publisher | Trans Tech Publications, Ltd. | ||
| DOI | doi:10.4028/www.scientific.net/msf.389-393.629Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9851899 | Long-form Identifier | mindat:1:5:9851899:9 |
| GUID | 0 | ||
| Full Reference | Nakashima, Shinichi, Nakatake, Yasuhiro, Ishida, Yuuki, Takahashi, Tetsuo, Okumura, Hajime (2002) Sensitive Detection of Defects in α and β SiC by Raman Scattering. Materials Science Forum, 389. 629-632 doi:10.4028/www.scientific.net/msf.389-393.629 | ||
| Plain Text | Nakashima, Shinichi, Nakatake, Yasuhiro, Ishida, Yuuki, Takahashi, Tetsuo, Okumura, Hajime (2002) Sensitive Detection of Defects in α and β SiC by Raman Scattering. Materials Science Forum, 389. 629-632 doi:10.4028/www.scientific.net/msf.389-393.629 | ||
| In | (2002) Materials Science Forum Vol. 389. Trans Tech Publications, Ltd. | ||
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