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Stoemenos, J., Komninou, Ph., Karakostas, Th., Georgakilas, A., Christou, A. (1993) TEM Study of Inversion Antiphase Domain Boundaries on GaAs/Si Interphase Grown by MBE. Materials Science Forum, 126. 631-634 doi:10.4028/www.scientific.net/msf.126-128.631

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Reference TypeJournal (article/letter/editorial)
TitleTEM Study of Inversion Antiphase Domain Boundaries on GaAs/Si Interphase Grown by MBE
JournalMaterials Science Forum
AuthorsStoemenos, J.Author
Komninou, Ph.Author
Karakostas, Th.Author
Georgakilas, A.Author
Christou, A.Author
Year1993 (January)Volume126
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/msf.126-128.631Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9841384Long-form Identifiermindat:1:5:9841384:3
GUID0
Full ReferenceStoemenos, J., Komninou, Ph., Karakostas, Th., Georgakilas, A., Christou, A. (1993) TEM Study of Inversion Antiphase Domain Boundaries on GaAs/Si Interphase Grown by MBE. Materials Science Forum, 126. 631-634 doi:10.4028/www.scientific.net/msf.126-128.631
Plain TextStoemenos, J., Komninou, Ph., Karakostas, Th., Georgakilas, A., Christou, A. (1993) TEM Study of Inversion Antiphase Domain Boundaries on GaAs/Si Interphase Grown by MBE. Materials Science Forum, 126. 631-634 doi:10.4028/www.scientific.net/msf.126-128.631
In(1993) Materials Science Forum Vol. 126. Trans Tech Publications, Ltd.

See Also

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Provataris, G.M., Polychroniadis, Efstathios K., Doni, E.G., Komninou, Ph., Kehagias, Th., Karakostas, Th., Delavignette, P. (1993) A Software Package for Grain Boundary Characterization by TEM. Materials Science Forum, 126. 257-260 doi:10.4028/www.scientific.net/msf.126-128.257
Komninou, Ph., Stoemenos, J., Dimitrakopulos, G. P., Karakostas, Th. (1994) Misfit dislocations and antiphase domain boundaries in GaAs/Si interface. Journal of Applied Physics, 75 (1). 143-152 doi:10.1063/1.355903
Kehagias, Th., Komninou, Ph., Dimitrakopulos, G.P., Polychroniadis, Efstathios K., Antonopoulos, J.G., Karakostas, Th. (1993) Grain Boundary Dislocation Structures in Deformed Hexagonal Close-Packed Metals. Materials Science Forum, 126. 149-152 doi:10.4028/www.scientific.net/msf.126-128.149
Komninou, Ph., Nouet, Gerard, Kehagias, Th., Serra, A., Karakostas, Th. (1998) Structural Characteristics of Twin Boundaries in Deformed Polycrystalline Zirconium. Materials Science Forum, 294. 365-368 doi:10.4028/www.scientific.net/msf.294-296.365
Pénisson, Jean-Michel (1993) HREM Study of Grain and Interphase Boundaries: Structural and Chemical Aspects. Materials Science Forum, 126. 35-44 doi:10.4028/www.scientific.net/msf.126-128.35
Dimitrakopulos, G. P., Komninou, Ph., Kioseoglou, J., Kehagias, Th., Sarigiannidou, E., Georgakilas, A., Nouet, G., Karakostas, Th. (2001) Structural transition of inversion domain boundaries through interactions with stacking faults in epitaxial GaN. Physical Review B, 64 (24) doi:10.1103/physrevb.64.245325
Gladkov, P., Varblianska, K., Marinova, Ts., Krastev, V., Stoemenos, J. (1993) Characterization of the Interface Ta/GaAs in Schottky Barrier Structures Prepared by Low Energy RF Sputtering with X-Ray Photoemission, TEM and Optical Transmittance Measurements. Materials Science Forum, 126. 463-466 doi:10.4028/www.scientific.net/msf.126-128.463
Christou, A., Stoemenos, J., Flevaris, N., Komninou, Ph., Georgakilas, A. (1990) Defect microstructure in laser‐assisted modulation molecular‐beam epitaxy GaAs on (100) silicon. Journal of Applied Physics, 68 (7). 3298-3302 doi:10.1063/1.346380
Muschik, T., Sommer, J., Herzig, Christian, Gust, W. (1993) The Influence of Interfacial Structure on the Diffusion of Ag along Ag-Cu Interphase Boundaries. Materials Science Forum, 126. 407-410 doi:10.4028/www.scientific.net/msf.126-128.407
Pastrňák, J., Bosacchi, A., Salokatve, A., Varrio, J., Láznicka, M. (1991) Characterization of MBE Grown Si Doped GaAs Layers on (100) GaAs and Si Substrates by Photoluminescence. Materials Science Forum, 69. 179-182 doi:10.4028/www.scientific.net/msf.69.179
Gourbilleau, F., Nouet, Gerard (1993) Analysis of SiC-SiO2 Interfaces by TEM. Materials Science Forum, 126. 599-602 doi:10.4028/www.scientific.net/msf.126-128.599
 
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