Gladkov, P., Varblianska, K., Marinova, Ts., Krastev, V., Stoemenos, J. (1993) Characterization of the Interface Ta/GaAs in Schottky Barrier Structures Prepared by Low Energy RF Sputtering with X-Ray Photoemission, TEM and Optical Transmittance Measurements. Materials Science Forum, 126. 463-466 doi:10.4028/www.scientific.net/msf.126-128.463
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Characterization of the Interface Ta/GaAs in Schottky Barrier Structures Prepared by Low Energy RF Sputtering with X-Ray Photoemission, TEM and Optical Transmittance Measurements | ||
| Journal | Materials Science Forum | ||
| Authors | Gladkov, P. | Author | |
| Varblianska, K. | Author | ||
| Marinova, Ts. | Author | ||
| Krastev, V. | Author | ||
| Stoemenos, J. | Author | ||
| Year | 1993 (January) | Volume | 126 |
| Publisher | Trans Tech Publications, Ltd. | ||
| DOI | doi:10.4028/www.scientific.net/msf.126-128.463Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9841340 | Long-form Identifier | mindat:1:5:9841340:9 |
| GUID | 0 | ||
| Full Reference | Gladkov, P., Varblianska, K., Marinova, Ts., Krastev, V., Stoemenos, J. (1993) Characterization of the Interface Ta/GaAs in Schottky Barrier Structures Prepared by Low Energy RF Sputtering with X-Ray Photoemission, TEM and Optical Transmittance Measurements. Materials Science Forum, 126. 463-466 doi:10.4028/www.scientific.net/msf.126-128.463 | ||
| Plain Text | Gladkov, P., Varblianska, K., Marinova, Ts., Krastev, V., Stoemenos, J. (1993) Characterization of the Interface Ta/GaAs in Schottky Barrier Structures Prepared by Low Energy RF Sputtering with X-Ray Photoemission, TEM and Optical Transmittance Measurements. Materials Science Forum, 126. 463-466 doi:10.4028/www.scientific.net/msf.126-128.463 | ||
| In | (1993) Materials Science Forum Vol. 126. Trans Tech Publications, Ltd. | ||
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