Choi, Eunmi, Kim, Areum, Kwon, Soon Hyeong, Pyo, Sung Gyu (2017) Effect of Interface Treatment on the Voltage Linearity in 8 fF/μm2 High-k Dielectric and Combination Stacks on Metal Insulator Metal (MIM) Capacitor. Science of Advanced Materials, 10. 467-470 doi:10.1166/sam.2018.3044
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Effect of Interface Treatment on the Voltage Linearity in 8 fF/μm2 High-k Dielectric and Combination Stacks on Metal Insulator Metal (MIM) Capacitor | ||
| Journal | Science of Advanced Materials | ||
| Authors | Choi, Eunmi | Author | |
| Kim, Areum | Author | ||
| Kwon, Soon Hyeong | Author | ||
| Pyo, Sung Gyu | Author | ||
| Year | 2017 (April 1) | Volume | 10 |
| Publisher | American Scientific Publishers | ||
| DOI | doi:10.1166/sam.2018.3044Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9255571 | Long-form Identifier | mindat:1:5:9255571:2 |
| GUID | 0 | ||
| Full Reference | Choi, Eunmi, Kim, Areum, Kwon, Soon Hyeong, Pyo, Sung Gyu (2017) Effect of Interface Treatment on the Voltage Linearity in 8 fF/μm2 High-k Dielectric and Combination Stacks on Metal Insulator Metal (MIM) Capacitor. Science of Advanced Materials, 10. 467-470 doi:10.1166/sam.2018.3044 | ||
| Plain Text | Choi, Eunmi, Kim, Areum, Kwon, Soon Hyeong, Pyo, Sung Gyu (2017) Effect of Interface Treatment on the Voltage Linearity in 8 fF/μm2 High-k Dielectric and Combination Stacks on Metal Insulator Metal (MIM) Capacitor. Science of Advanced Materials, 10. 467-470 doi:10.1166/sam.2018.3044 | ||
| In | (n.d.) Science of Advanced Materials Vol. 10. American Scientific Publishers | ||
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