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Yang, W. Q., Dai, L., Ma, R. M., Liu, C., Sun, T., Qin, G. G. (2008) Back-gate ZnO nanowire field-effect transistors each with a top Ω shaped Au contact. Applied Physics Letters, 93 (3). 33102pp. doi:10.1063/1.2959075

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Reference TypeJournal (article/letter/editorial)
TitleBack-gate ZnO nanowire field-effect transistors each with a top Ω shaped Au contact
JournalApplied Physics Letters
AuthorsYang, W. Q.Author
Dai, L.Author
Ma, R. M.Author
Liu, C.Author
Sun, T.Author
Qin, G. G.Author
Year2008 (July 21)Volume93
Issue3
PublisherAIP Publishing
DOIdoi:10.1063/1.2959075Search in ResearchGate
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Mindat Ref. ID8570507Long-form Identifiermindat:1:5:8570507:2
GUID0
Full ReferenceYang, W. Q., Dai, L., Ma, R. M., Liu, C., Sun, T., Qin, G. G. (2008) Back-gate ZnO nanowire field-effect transistors each with a top Ω shaped Au contact. Applied Physics Letters, 93 (3). 33102pp. doi:10.1063/1.2959075
Plain TextYang, W. Q., Dai, L., Ma, R. M., Liu, C., Sun, T., Qin, G. G. (2008) Back-gate ZnO nanowire field-effect transistors each with a top Ω shaped Au contact. Applied Physics Letters, 93 (3). 33102pp. doi:10.1063/1.2959075
In(2008, July) Applied Physics Letters Vol. 93 (3) AIP Publishing

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Ma, R. M., Dai, L., Qin, G. G. (2007) Enhancement-mode metal-semiconductor field-effect transistors based on single n-CdS nanowires. Applied Physics Letters, 90 (9). 93109pp. doi:10.1063/1.2710004
Wu, P. C., Ye, Y., Liu, C., Ma, R. M., Sun, T., Dai, L. (2009) Logic gates constructed on CdS nanobelt field-effect transistors with high-κ HfO2 top-gate dielectrics. Journal of Materials Chemistry, 19. 7296pp. doi:10.1039/b909595k
Huo, H. B., Liu, C., Dai, L., You, L. P., Yang, W. Q., Ma, R. M., Zhang, Y. F., Qin, G. G. (2007) A method to identify shallow dopants in semiconductor nanowires. Applied Physics Letters, 91 (18). 181117pp. doi:10.1063/1.2805019
Naber, R. C. G., Bird, M., Sirringhaus, H. (2008) A gate dielectric that enables high ambipolar mobilities in polymer light-emitting field-effect transistors. Applied Physics Letters, 93 (2). 23301pp. doi:10.1063/1.2957472
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Theodorou, C. G., Fasarakis, N., Hoffman, T., Chiarella, T., Ghibaudo, G., Dimitriadis, C. A. (2012) Flicker noise in n-channel nanoscale tri-gate fin-shaped field-effect transistors. Applied Physics Letters, 101 (24). 243512pp. doi:10.1063/1.4772590
 
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