| Reference Type | Journal (article/letter/editorial) |
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| Title | Secondary electron imaging of embedded defects in carbon nanofiber via interconnects |
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| Journal | Applied Physics Letters |
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| Authors | Suzuki, Makoto | Author |
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| Ominami, Yusuke | Author |
| Sekiguchi, Takashi | Author |
| Yang, Cary Y. | Author |
| Year | 2008 (December 29) | Volume | 93 |
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| Issue | 26 |
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| Publisher | AIP Publishing |
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| DOI | doi:10.1063/1.3063053Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 8570404 | Long-form Identifier | mindat:1:5:8570404:6 |
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|
| GUID | 0 |
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| Full Reference | Suzuki, Makoto, Ominami, Yusuke, Sekiguchi, Takashi, Yang, Cary Y. (2008) Secondary electron imaging of embedded defects in carbon nanofiber via interconnects. Applied Physics Letters, 93 (26). 263110pp. doi:10.1063/1.3063053 |
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| Plain Text | Suzuki, Makoto, Ominami, Yusuke, Sekiguchi, Takashi, Yang, Cary Y. (2008) Secondary electron imaging of embedded defects in carbon nanofiber via interconnects. Applied Physics Letters, 93 (26). 263110pp. doi:10.1063/1.3063053 |
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| In | (2008, December) Applied Physics Letters Vol. 93 (26) AIP Publishing |
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