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Kitsuki, Hirohiko, Yamada, Toshishige, Fabris, Drazen, Jameson, John R., Wilhite, Patrick, Suzuki, Makoto, Yang, Cary Y. (2008) Length dependence of current-induced breakdown in carbon nanofiber interconnects. Applied Physics Letters, 92 (17). 173110pp. doi:10.1063/1.2918839

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Reference TypeJournal (article/letter/editorial)
TitleLength dependence of current-induced breakdown in carbon nanofiber interconnects
JournalApplied Physics Letters
AuthorsKitsuki, HirohikoAuthor
Yamada, ToshishigeAuthor
Fabris, DrazenAuthor
Jameson, John R.Author
Wilhite, PatrickAuthor
Suzuki, MakotoAuthor
Yang, Cary Y.Author
Year2008 (April 28)Volume92
Issue17
PublisherAIP Publishing
DOIdoi:10.1063/1.2918839Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8563003Long-form Identifiermindat:1:5:8563003:3
GUID0
Full ReferenceKitsuki, Hirohiko, Yamada, Toshishige, Fabris, Drazen, Jameson, John R., Wilhite, Patrick, Suzuki, Makoto, Yang, Cary Y. (2008) Length dependence of current-induced breakdown in carbon nanofiber interconnects. Applied Physics Letters, 92 (17). 173110pp. doi:10.1063/1.2918839
Plain TextKitsuki, Hirohiko, Yamada, Toshishige, Fabris, Drazen, Jameson, John R., Wilhite, Patrick, Suzuki, Makoto, Yang, Cary Y. (2008) Length dependence of current-induced breakdown in carbon nanofiber interconnects. Applied Physics Letters, 92 (17). 173110pp. doi:10.1063/1.2918839
In(2008, April) Applied Physics Letters Vol. 92 (17) AIP Publishing

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