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Chen, Fang, Huang, Zhifeng, Tao, Nongjian (2007) Forming single molecular junctions between indium tin oxide electrodes. Applied Physics Letters, 91 (16). 162106pp. doi:10.1063/1.2800303

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Reference TypeJournal (article/letter/editorial)
TitleForming single molecular junctions between indium tin oxide electrodes
JournalApplied Physics Letters
AuthorsChen, FangAuthor
Huang, ZhifengAuthor
Tao, NongjianAuthor
Year2007 (October 15)Volume91
Issue16
PublisherAIP Publishing
DOIdoi:10.1063/1.2800303Search in ResearchGate
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Mindat Ref. ID8556545Long-form Identifiermindat:1:5:8556545:6
GUID0
Full ReferenceChen, Fang, Huang, Zhifeng, Tao, Nongjian (2007) Forming single molecular junctions between indium tin oxide electrodes. Applied Physics Letters, 91 (16). 162106pp. doi:10.1063/1.2800303
Plain TextChen, Fang, Huang, Zhifeng, Tao, Nongjian (2007) Forming single molecular junctions between indium tin oxide electrodes. Applied Physics Letters, 91 (16). 162106pp. doi:10.1063/1.2800303
In(2007, October) Applied Physics Letters Vol. 91 (16) AIP Publishing

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Manivannan, P., Subrahmanyam, A. (1994) Electrical characterization of electron beam evaporated indium tin oxide/indium phosphide junctions. Journal of Applied Physics, 76 (5). 2912-2917 doi:10.1063/1.357529
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