Xie, J., Özgür, Ü., Fu, Y., Ni, X., Morkoç, H., Inoki, C. K., Kuan, T. S., Foreman, J. V., Everitt, H. O. (2007) Low dislocation densities and long carrier lifetimes in GaN thin films grown on a SiNx nanonetwork. Applied Physics Letters, 90 (4). 41107pp. doi:10.1063/1.2433754
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Low dislocation densities and long carrier lifetimes in GaN thin films grown on a SiNx nanonetwork | ||
| Journal | Applied Physics Letters | ||
| Authors | Xie, J. | Author | |
| Özgür, Ü. | Author | ||
| Fu, Y. | Author | ||
| Ni, X. | Author | ||
| Morkoç, H. | Author | ||
| Inoki, C. K. | Author | ||
| Kuan, T. S. | Author | ||
| Foreman, J. V. | Author | ||
| Everitt, H. O. | Author | ||
| Year | 2007 (January 22) | Volume | 90 |
| Issue | 4 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.2433754Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8555037 | Long-form Identifier | mindat:1:5:8555037:5 |
| GUID | 0 | ||
| Full Reference | Xie, J., Özgür, Ü., Fu, Y., Ni, X., Morkoç, H., Inoki, C. K., Kuan, T. S., Foreman, J. V., Everitt, H. O. (2007) Low dislocation densities and long carrier lifetimes in GaN thin films grown on a SiNx nanonetwork. Applied Physics Letters, 90 (4). 41107pp. doi:10.1063/1.2433754 | ||
| Plain Text | Xie, J., Özgür, Ü., Fu, Y., Ni, X., Morkoç, H., Inoki, C. K., Kuan, T. S., Foreman, J. V., Everitt, H. O. (2007) Low dislocation densities and long carrier lifetimes in GaN thin films grown on a SiNx nanonetwork. Applied Physics Letters, 90 (4). 41107pp. doi:10.1063/1.2433754 | ||
| In | (2007, January) Applied Physics Letters Vol. 90 (4) AIP Publishing | ||
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