Parikh, A., Yarbrough, W., Mason, M., Sridhar, S., Chidambaram, P. R., Cai, Z. (2007) Characterization of structure and morphology of an advanced p-channel field effect transistor under uniaxial stress by synchrotron x-ray diffraction. Applied Physics Letters, 90 (17). 172117pp. doi:10.1063/1.2734480
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Characterization of structure and morphology of an advanced p-channel field effect transistor under uniaxial stress by synchrotron x-ray diffraction | ||
| Journal | Applied Physics Letters | ||
| Authors | Parikh, A. | Author | |
| Yarbrough, W. | Author | ||
| Mason, M. | Author | ||
| Sridhar, S. | Author | ||
| Chidambaram, P. R. | Author | ||
| Cai, Z. | Author | ||
| Year | 2007 (April 23) | Volume | 90 |
| Issue | 17 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.2734480Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8553732 | Long-form Identifier | mindat:1:5:8553732:9 |
| GUID | 0 | ||
| Full Reference | Parikh, A., Yarbrough, W., Mason, M., Sridhar, S., Chidambaram, P. R., Cai, Z. (2007) Characterization of structure and morphology of an advanced p-channel field effect transistor under uniaxial stress by synchrotron x-ray diffraction. Applied Physics Letters, 90 (17). 172117pp. doi:10.1063/1.2734480 | ||
| Plain Text | Parikh, A., Yarbrough, W., Mason, M., Sridhar, S., Chidambaram, P. R., Cai, Z. (2007) Characterization of structure and morphology of an advanced p-channel field effect transistor under uniaxial stress by synchrotron x-ray diffraction. Applied Physics Letters, 90 (17). 172117pp. doi:10.1063/1.2734480 | ||
| In | (2007, April) Applied Physics Letters Vol. 90 (17) AIP Publishing | ||
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