登录注册
Quick Links : Mindat手册The Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
主页关于 MindatMindat手册Mindat的历史版权Who We Are联系我们于 Mindat.org刊登广告
捐赠给 MindatCorporate Sponsorship赞助板页已赞助的板页在 Mindat刊登 广告的广告商于 Mindat.org刊登广告
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
搜索矿物的性质搜索矿物的化学Mineral Visual ExplorerAdvanced Locality Search随意显示任何一 种矿物Random Locality使用minID搜索邻近产地Search Articles搜索词汇表更多搜索选项
搜索:
矿物名称:
地区产地名称:
关键字:
 
Mindat手册添加新照片Rate Photos产区编辑报告Coordinate Completion Report添加词汇表项目
Mining Companies统计会员列表Mineral MuseumsClubs & Organizations矿物展及活动The Mindat目录表设备设置The Mineral QuizTime Machine
照片搜索Photo GalleriesSearch by ColorPhoto Colour Explorer今天最新的照片昨天最新的照片用户照片相集过去每日精选照片相集Photography

Trupke, T., Bardos, R. A., Schubert, M. C., Warta, W. (2006) Photoluminescence imaging of silicon wafers. Applied Physics Letters, 89 (4). 44107pp. doi:10.1063/1.2234747

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitlePhotoluminescence imaging of silicon wafers
JournalApplied Physics Letters
AuthorsTrupke, T.Author
Bardos, R. A.Author
Schubert, M. C.Author
Warta, W.Author
Year2006 (July 24)Volume89
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/1.2234747Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8551858Long-form Identifiermindat:1:5:8551858:2
GUID0
Full ReferenceTrupke, T., Bardos, R. A., Schubert, M. C., Warta, W. (2006) Photoluminescence imaging of silicon wafers. Applied Physics Letters, 89 (4). 44107pp. doi:10.1063/1.2234747
Plain TextTrupke, T., Bardos, R. A., Schubert, M. C., Warta, W. (2006) Photoluminescence imaging of silicon wafers. Applied Physics Letters, 89 (4). 44107pp. doi:10.1063/1.2234747
In(2006, July) Applied Physics Letters Vol. 89 (4) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Bardos, R. A., Trupke, T., Schubert, M. C., Roth, T. (2006) Trapping artifacts in quasi-steady-state photoluminescence and photoconductance lifetime measurements on silicon wafers. Applied Physics Letters, 88 (5). 53504pp. doi:10.1063/1.2165274
Trupke, T., Bardos, R. A., Abbott, M. D., Cotter, J. E. (2005) Suns-photoluminescence: Contactless determination of current-voltage characteristics of silicon wafers. Applied Physics Letters, 87 (9). 93503pp. doi:10.1063/1.2034109
Giesecke, J. A., Schubert, M. C., Walter, D., Warta, W. (2010) Minority carrier lifetime in silicon wafers from quasi-steady-state photoluminescence. Applied Physics Letters, 97 (9). 92109pp. doi:10.1063/1.3485216
Abbott, M. D., Cotter, J. E., Trupke, T., Bardos, R. A. (2006) Investigation of edge recombination effects in silicon solar cell structures using photoluminescence. Applied Physics Letters, 88 (11). 114105pp. doi:10.1063/1.2186510
Sio, H. C., Xiong, Z., Trupke, T., Macdonald, D. (2012) Imaging crystal orientations in multicrystalline silicon wafers via photoluminescence. Applied Physics Letters, 101 (8). 82102pp. doi:10.1063/1.4747801
Abbott, M. D., Cotter, J. E., Chen, F. W., Trupke, T., Bardos, R. A., Fisher, K. C. (2006) Application of photoluminescence characterization to the development and manufacturing of high-efficiency silicon solar cells. Journal of Applied Physics, 100 (11). 114514pp. doi:10.1063/1.2398724
Trupke, T., Pink, E., Bardos, R. A., Abbott, M. D. (2007) Spatially resolved series resistance of silicon solar cells obtained from luminescence imaging. Applied Physics Letters, 90 (9). 93506pp. doi:10.1063/1.2709630
Trupke, T., Bardos, R. A., Abbott, M. D. (2005) Self-consistent calibration of photoluminescence and photoconductance lifetime measurements. Applied Physics Letters, 87 (18). 184102pp. doi:10.1063/1.2119411
Sio, H. C., Trupke, T., Macdonald, D. (2014) Quantifying carrier recombination at grain boundaries in multicrystalline silicon wafers through photoluminescence imaging. Journal of Applied Physics, 116 (24). 244905pp. doi:10.1063/1.4904963
Macdonald, D., Roth, T., Deenapanray, P. N. K., Trupke, T., Bardos, R. A. (2006) Doping dependence of the carrier lifetime crossover point upon dissociation of iron-boron pairs in crystalline silicon. Applied Physics Letters, 89 (14). 142107pp. doi:10.1063/1.2358126
Schubert, Martin C., Isenberg, Joerg, Warta, Wilhelm (2003) Spatially resolved lifetime imaging of silicon wafers by measurement of infrared emission. Journal of Applied Physics, 94 (6). 4139-4143 doi:10.1063/1.1600531
 
and/or  
版权所有© mindat.org1993年至2026年，除了规定的地方。 Mindat.org全赖于全球数千个以上成员和支持者们的参与。
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
隐私政策 - 条款和条款细则 - 联络我们 - Report a bug/vulnerability Current server date and time: 2026.6.8 01:25:03
Go to top of page