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Trupke, T., Bardos, R. A., Abbott, M. D., Cotter, J. E. (2005) Suns-photoluminescence: Contactless determination of current-voltage characteristics of silicon wafers. Applied Physics Letters, 87 (9). 93503pp. doi:10.1063/1.2034109

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Reference TypeJournal (article/letter/editorial)
TitleSuns-photoluminescence: Contactless determination of current-voltage characteristics of silicon wafers
JournalApplied Physics Letters
AuthorsTrupke, T.Author
Bardos, R. A.Author
Abbott, M. D.Author
Cotter, J. E.Author
Year2005 (August 29)Volume87
Issue9
PublisherAIP Publishing
DOIdoi:10.1063/1.2034109Search in ResearchGate
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Mindat Ref. ID8546232Long-form Identifiermindat:1:5:8546232:6
GUID0
Full ReferenceTrupke, T., Bardos, R. A., Abbott, M. D., Cotter, J. E. (2005) Suns-photoluminescence: Contactless determination of current-voltage characteristics of silicon wafers. Applied Physics Letters, 87 (9). 93503pp. doi:10.1063/1.2034109
Plain TextTrupke, T., Bardos, R. A., Abbott, M. D., Cotter, J. E. (2005) Suns-photoluminescence: Contactless determination of current-voltage characteristics of silicon wafers. Applied Physics Letters, 87 (9). 93503pp. doi:10.1063/1.2034109
In(2005, August) Applied Physics Letters Vol. 87 (9) AIP Publishing

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Abbott, M. D., Cotter, J. E., Trupke, T., Bardos, R. A. (2006) Investigation of edge recombination effects in silicon solar cell structures using photoluminescence. Applied Physics Letters, 88 (11). 114105pp. doi:10.1063/1.2186510
Trupke, T., Bardos, R. A., Abbott, M. D. (2005) Self-consistent calibration of photoluminescence and photoconductance lifetime measurements. Applied Physics Letters, 87 (18). 184102pp. doi:10.1063/1.2119411
Trupke, T., Bardos, R. A., Schubert, M. C., Warta, W. (2006) Photoluminescence imaging of silicon wafers. Applied Physics Letters, 89 (4). 44107pp. doi:10.1063/1.2234747
Abbott, M. D., Cotter, J. E., Chen, F. W., Trupke, T., Bardos, R. A., Fisher, K. C. (2006) Application of photoluminescence characterization to the development and manufacturing of high-efficiency silicon solar cells. Journal of Applied Physics, 100 (11). 114514pp. doi:10.1063/1.2398724
Abbott, M. D., Bardos, R. A., Trupke, T., Fisher, K. C., Pink, E. (2007) The effect of diffusion-limited lifetime on implied current voltage curves based on photoluminescence data. Journal of Applied Physics, 102 (4). 44502pp. doi:10.1063/1.2756529
Trupke, T., Pink, E., Bardos, R. A., Abbott, M. D. (2007) Spatially resolved series resistance of silicon solar cells obtained from luminescence imaging. Applied Physics Letters, 90 (9). 93506pp. doi:10.1063/1.2709630
Bardos, R. A., Trupke, T., Schubert, M. C., Roth, T. (2006) Trapping artifacts in quasi-steady-state photoluminescence and photoconductance lifetime measurements on silicon wafers. Applied Physics Letters, 88 (5). 53504pp. doi:10.1063/1.2165274
Hameiri, Ziv, Rougieux, Fiacre, Sinton, Ron, Trupke, Thorsten (2014) Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements. Applied Physics Letters, 104 (7). 73506pp. doi:10.1063/1.4865804
Sio, H. C., Xiong, Z., Trupke, T., Macdonald, D. (2012) Imaging crystal orientations in multicrystalline silicon wafers via photoluminescence. Applied Physics Letters, 101 (8). 82102pp. doi:10.1063/1.4747801
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Sio, H. C., Trupke, T., Macdonald, D. (2014) Quantifying carrier recombination at grain boundaries in multicrystalline silicon wafers through photoluminescence imaging. Journal of Applied Physics, 116 (24). 244905pp. doi:10.1063/1.4904963
 
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