| Reference Type | Journal (article/letter/editorial) |
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| Title | Temperature-resolved X-ray diffractometry as a thermoanalytical method |
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| Journal | Journal of Thermal Analysis |
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| Authors | Epple, M. | Author |
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| Cammenga, H. K. | Author |
| Year | 1992 (April) | Volume | 38 |
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| Issue | 4 |
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| Publisher | Springer Science and Business Media LLC |
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| DOI | doi:10.1007/bf01979389Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 7948849 | Long-form Identifier | mindat:1:5:7948849:3 |
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| GUID | 0 |
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| Full Reference | Epple, M., Cammenga, H. K. (1992) Temperature-resolved X-ray diffractometry as a thermoanalytical method. Journal of Thermal Analysis, 38 (4). 619-626 doi:10.1007/bf01979389 |
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| Plain Text | Epple, M., Cammenga, H. K. (1992) Temperature-resolved X-ray diffractometry as a thermoanalytical method. Journal of Thermal Analysis, 38 (4). 619-626 doi:10.1007/bf01979389 |
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| In | (1992, April) Journal of Thermal Analysis Vol. 38 (4) Springer Science and Business Media LLC |
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