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Lee, J. L. S., Gilmore, I. S., Seah, M. P. (2008) Quantification and methodology issues in multivariate analysis of ToF-SIMS data for mixed organic systems. Surface and Interface Analysis, 40 (1). 1-14 doi:10.1002/sia.2713

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Reference TypeJournal (article/letter/editorial)
TitleQuantification and methodology issues in multivariate analysis of ToF-SIMS data for mixed organic systems
JournalSurface and Interface Analysis
AuthorsLee, J. L. S.Author
Gilmore, I. S.Author
Seah, M. P.Author
Year2008 (January)Volume40
Issue1
PublisherWiley
DOIdoi:10.1002/sia.2713Search in ResearchGate
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Mindat Ref. ID6510872Long-form Identifiermindat:1:5:6510872:1
GUID0
Full ReferenceLee, J. L. S., Gilmore, I. S., Seah, M. P. (2008) Quantification and methodology issues in multivariate analysis of ToF-SIMS data for mixed organic systems. Surface and Interface Analysis, 40 (1). 1-14 doi:10.1002/sia.2713
Plain TextLee, J. L. S., Gilmore, I. S., Seah, M. P. (2008) Quantification and methodology issues in multivariate analysis of ToF-SIMS data for mixed organic systems. Surface and Interface Analysis, 40 (1). 1-14 doi:10.1002/sia.2713
In(2008, January) Surface and Interface Analysis Vol. 40 (1) Wiley

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Lee, J. L. S., Gilmore, I. S., Fletcher, I. W., Seah, M. P. (2009) Multivariate image analysis strategies for ToF-SIMS images with topography. Surface and Interface Analysis, 41 (8). 653-665 doi:10.1002/sia.3070
Lee, J. L. S., Gilmore, I. S., Seah, M. P. (2012) Linearity of the instrumental intensity scale in TOF-SIMS-a VAMAS interlaboratory study. Surface and Interface Analysis, 44 (1). 1-14 doi:10.1002/sia.3761
Gilmore, I. S., Seah, M. P., Johnstone, J. E. (2003) Quantification issues in ToF-SSIMS and AFM co-analysis in two-phase systems, exampled by a polymer blend. Surface and Interface Analysis, 35 (11). 888-896 doi:10.1002/sia.1616
Seah, M. P., Gilmore, I. S. (2011) Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMS. Surface and Interface Analysis, 43 (1). 228-235 doi:10.1002/sia.3491
Lee, J. L. S., Tyler, B. J., Wagner, M. S., Gilmore, I. S., Seah, M. P. (2009) The development of standards and guides for multivariate analysis in surface chemical analysis. Surface and Interface Analysis, 41 (2). 76-78 doi:10.1002/sia.2935
Green, F. M., Gilmore, I. S., Lee, J. L. S., Spencer, S. J., Seah, M. P. (2010) Static SIMS-VAMAS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantification. Surface and Interface Analysis, 42 (3). 129-138 doi:10.1002/sia.3181
Gilmore, I. S., Seah, M. P., Green, F. M. (2005) Static TOF-SIMS — a VAMAS interlaboratory study. Part I. Repeatability and reproducibility of spectra. Surface and Interface Analysis, 37 (8). 651-672 doi:10.1002/sia.2061
Gilmore, I. S., Green, F. M., Seah, M. P. (2007) Static TOF-SIMS. A VAMAS interlaboratory study. Part II — accuracy of the mass scale and G-SIMS compatibility. Surface and Interface Analysis, 39 (10). 817-825 doi:10.1002/sia.2596
Salter, T. L., Green, F. M., Gilmore, I. S., Seah, M. P., Stokes, P. (2011) A comparison of SIMS and DESI and their complementarities. Surface and Interface Analysis, 43 (1). 294-297 doi:10.1002/sia.3412
Smentkowski, V. S., Ostrowski, S. G., Kollmer, F., Schnieders, A., Keenan, M. R., Ohlhausen, J. A., Kotula, P. G. (2008) Multivariate statistical analysis of non-mass-selected ToF-SIMS data. Surface and Interface Analysis, 40 (8). 1176-1182 doi:10.1002/sia.2862
Gilmore, I. S., Seah, M. P. (1995) Static SIMS: Surface charge stabilization of insulators for highly repeatable spectra when using a quadrupole mass spectrometer. Surface and Interface Analysis, 23 (4). 191-203 doi:10.1002/sia.740230402
 
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