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Gilmore, I. S., Seah, M. P., Green, F. M. (2005) Static TOF-SIMS — a VAMAS interlaboratory study. Part I. Repeatability and reproducibility of spectra. Surface and Interface Analysis, 37 (8). 651-672 doi:10.1002/sia.2061

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Reference TypeJournal (article/letter/editorial)
TitleStatic TOF-SIMS — a VAMAS interlaboratory study. Part I. Repeatability and reproducibility of spectra
JournalSurface and Interface Analysis
AuthorsGilmore, I. S.Author
Seah, M. P.Author
Green, F. M.Author
Year2005 (August)Volume37
Issue8
PublisherWiley
DOIdoi:10.1002/sia.2061Search in ResearchGate
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Mindat Ref. ID6509756Long-form Identifiermindat:1:5:6509756:8
GUID0
Full ReferenceGilmore, I. S., Seah, M. P., Green, F. M. (2005) Static TOF-SIMS — a VAMAS interlaboratory study. Part I. Repeatability and reproducibility of spectra. Surface and Interface Analysis, 37 (8). 651-672 doi:10.1002/sia.2061
Plain TextGilmore, I. S., Seah, M. P., Green, F. M. (2005) Static TOF-SIMS — a VAMAS interlaboratory study. Part I. Repeatability and reproducibility of spectra. Surface and Interface Analysis, 37 (8). 651-672 doi:10.1002/sia.2061
In(2005, August) Surface and Interface Analysis Vol. 37 (8) Wiley

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Gilmore, I. S., Green, F. M., Seah, M. P. (2007) Static TOF-SIMS. A VAMAS interlaboratory study. Part II — accuracy of the mass scale and G-SIMS compatibility. Surface and Interface Analysis, 39 (10). 817-825 doi:10.1002/sia.2596
Green, F. M., Gilmore, I. S., Lee, J. L. S., Spencer, S. J., Seah, M. P. (2010) Static SIMS-VAMAS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantification. Surface and Interface Analysis, 42 (3). 129-138 doi:10.1002/sia.3181
Lee, J. L. S., Gilmore, I. S., Seah, M. P. (2012) Linearity of the instrumental intensity scale in TOF-SIMS-a VAMAS interlaboratory study. Surface and Interface Analysis, 44 (1). 1-14 doi:10.1002/sia.3761
Lee, J. L. S., Gilmore, I. S., Fletcher, I. W., Seah, M. P. (2009) Multivariate image analysis strategies for ToF-SIMS images with topography. Surface and Interface Analysis, 41 (8). 653-665 doi:10.1002/sia.3070
Gilmore, I. S., Seah, M. P. (1995) Static SIMS: Surface charge stabilization of insulators for highly repeatable spectra when using a quadrupole mass spectrometer. Surface and Interface Analysis, 23 (4). 191-203 doi:10.1002/sia.740230402
Salter, T. L., Green, F. M., Gilmore, I. S., Seah, M. P., Stokes, P. (2011) A comparison of SIMS and DESI and their complementarities. Surface and Interface Analysis, 43 (1). 294-297 doi:10.1002/sia.3412
Seah, M. P., Clifford, C. A., Green, F. M., Gilmore, I. S. (2005) An accurate semi-empirical equation for sputtering yields I: for argon ions. Surface and Interface Analysis, 37 (5). 444-458 doi:10.1002/sia.2032
Seah, M. P., Gilmore, I. S. (2011) Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMS. Surface and Interface Analysis, 43 (1). 228-235 doi:10.1002/sia.3491
Ogaki, R., Green, F. M., Li, S., Vert, M., Alexander, M. R., Gilmore, I. S., Davies, M. C. (2008) A comparison of the static SIMS and G-SIMS spectra of biodegradable homo-polyesters. Surface and Interface Analysis, 40 (8). 1202-1208 doi:10.1002/sia.2866
Gilmore, I. S., Seah, M. P. (2000) Static SIMS inter-laboratory study. Surface and Interface Analysis, 29 (9). 624-637 doi:10.1002/1096-9918(200009)29:9<624::aid-sia908>3.0.co;2-f
Shard, A. G., Ray, S., Seah, M. P., Yang, L. (2011) VAMAS interlaboratory study on organic depth profiling. Surface and Interface Analysis, 43 (9). 1240-1250 doi:10.1002/sia.3705
 
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