登录注册
Quick Links : Mindat手册The Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
主页关于 MindatMindat手册Mindat的历史版权Who We Are联系我们于 Mindat.org刊登广告
捐赠给 MindatCorporate Sponsorship赞助板页已赞助的板页在 Mindat刊登 广告的广告商于 Mindat.org刊登广告
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
搜索矿物的性质搜索矿物的化学Mineral Visual ExplorerAdvanced Locality Search随意显示任何一 种矿物Random Locality使用minID搜索邻近产地Search Articles搜索词汇表更多搜索选项
搜索:
矿物名称:
地区产地名称:
关键字:
 
Mindat手册添加新照片Rate Photos产区编辑报告Coordinate Completion Report添加词汇表项目
Mining Companies统计会员列表Mineral MuseumsClubs & Organizations矿物展及活动The Mindat目录表设备设置The Mineral QuizTime Machine
照片搜索Photo GalleriesSearch by ColorPhoto Colour Explorer今天最新的照片昨天最新的照片用户照片相集过去每日精选照片相集Photography

Kim, K. J., Moon, D. W., Chi, P., Simons, D. (2005) Development of B-doped Si multiple delta-layer reference materials for SIMS profiling. Surface and Interface Analysis, 37 (10). 802-808 doi:10.1002/sia.2080

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleDevelopment of B-doped Si multiple delta-layer reference materials for SIMS profiling
JournalSurface and Interface Analysis
AuthorsKim, K. J.Author
Moon, D. W.Author
Chi, P.Author
Simons, D.Author
Year2005 (October)Volume37
Issue10
PublisherWiley
DOIdoi:10.1002/sia.2080Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6509449Long-form Identifiermindat:1:5:6509449:1
GUID0
Full ReferenceKim, K. J., Moon, D. W., Chi, P., Simons, D. (2005) Development of B-doped Si multiple delta-layer reference materials for SIMS profiling. Surface and Interface Analysis, 37 (10). 802-808 doi:10.1002/sia.2080
Plain TextKim, K. J., Moon, D. W., Chi, P., Simons, D. (2005) Development of B-doped Si multiple delta-layer reference materials for SIMS profiling. Surface and Interface Analysis, 37 (10). 802-808 doi:10.1002/sia.2080
In(2005, October) Surface and Interface Analysis Vol. 37 (10) Wiley

See Also

These are possibly similar items as determined by title/reference text matching only.

Lee, J. W., Kim, K. J., Kim, H. K., Moon, D. W. (2005) Deconvolution of SIMS depth profiles of As multiple delta layers in silicon. Surface and Interface Analysis, 37 (2). 176-180 doi:10.1002/sia.1958
Moon, D. W. (2005) Summary of ISO/TC 201 standard: XV. ISO 20341:2003—Surface chemical analysis—secondary ion mass spectrometry—method for estimating depth resolution parameters with multiple delta-layer reference materials. Surface and Interface Analysis, 37 (7). 646-647 doi:10.1002/sia.2057
Yoshihara, K., Moon, D. W., Fujita, D., Kim, K. J., Kajiwara, K. (1993) GaAs/AlAs superlattice as a proposed new reference material for sputter depth profiling. Surface and Interface Analysis, 20 (13). 1061-1066 doi:10.1002/sia.740201306
Kim, K. J., Moon, D. W., Park, C. J., Simons, D., Gillen, G., Jin, H., Kang, H. J. (2007) Quantitative surface analysis of FeNi alloy films by XPS, AES and SIMS. Surface and Interface Analysis, 39 (8). 665-673 doi:10.1002/sia.2575
Kim, K. J., Moon, D. W., Nam, S. H., Lee, W. J., Kim, H. G. (1995) XPS sputter depth profiling of the chemical states for SrTiO3/Si interface by O2+ ion beams. Surface and Interface Analysis, 23 (13). 851-857 doi:10.1002/sia.740231302
Moon, D. W., Won, J. Y., Kim, K. J., Kim, H. J., Kang, H. J., Petravic, M. (2000) GaAs delta-doped layers in Si for evaluation of SIMS depth resolution GaAs. Surface and Interface Analysis, 29 (6). 362-368 doi:10.1002/1096-9918(200006)29:6<362::aid-sia864>3.0.co;2-a
Kim, Tae Woon, Baek, Hyun Jeong, Jang, Jong Shik, Lee, Seung Mi, Kim, Kyung Joong (2014) SIMS depth profiling analysis of P-doped n-type Si layer to develop the Si QD solar cell. Surface and Interface Analysis, 46. 341-343 doi:10.1002/sia.5407
Houssiau, L., Noël, C., Mine, N., Jung, K. W., Min, W. J., Moon, D. W. (2014) Investigation of Cs surface layer formation in Cs-SIMS with TOF-MEIS and SIMS. Surface and Interface Analysis, 46. 22-24 doi:10.1002/sia.5614
Badheka, R., Wadsworth, M., Armour, D. G., van den Berg, J. A., Clegg, J. B. (1990) Theoretical and experimental studies of the broadening of dilute delta-doped Si spikes in GaAs during SIMS depth profiling. Surface and Interface Analysis, 15 (9). 550-558 doi:10.1002/sia.740150909
Sharma, V. K. M., McPhail, D. S., Fahy, M. R. (1995) Ion yield effects in the SIMS analysis of silicon delta-doped layers in GaAs. Surface and Interface Analysis, 23 (10). 723-728 doi:10.1002/sia.740231012
Moon, D. P. (1988) LMIS-SIMS studies of oxide scales. Surface and Interface Analysis, 12 (1). 27-34 doi:10.1002/sia.740120108
 
and/or  
版权所有© mindat.org1993年至2026年，除了规定的地方。 Mindat.org全赖于全球数千个以上成员和支持者们的参与。
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
隐私政策 - 条款和条款细则 - 联络我们 - Report a bug/vulnerability Current server date and time: 2026.6.7 22:07:39
Go to top of page