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Carter, G. (1997) Viscoelastic Relaxation and Sputter-depth Profiling of Amorphous Materials. Surface and Interface Analysis, 25 (1). 36-40 doi:10.1002/(sici)1096-9918(199701)25:1<36::aid-sia210>3.0.co;2-i

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Reference TypeJournal (article/letter/editorial)
TitleViscoelastic Relaxation and Sputter-depth Profiling of Amorphous Materials
JournalSurface and Interface Analysis
AuthorsCarter, G.Author
Year1997 (January)Volume25
Issue1
PublisherWiley
DOIdoi:10.1002/(sici)1096-9918(199701)25:1<36::aid-sia210>3.0.co;2-iSearch in ResearchGate
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Mindat Ref. ID6505657Long-form Identifiermindat:1:5:6505657:0
GUID0
Full ReferenceCarter, G. (1997) Viscoelastic Relaxation and Sputter-depth Profiling of Amorphous Materials. Surface and Interface Analysis, 25 (1). 36-40 doi:10.1002/(sici)1096-9918(199701)25:1<36::aid-sia210>3.0.co;2-i
Plain TextCarter, G. (1997) Viscoelastic Relaxation and Sputter-depth Profiling of Amorphous Materials. Surface and Interface Analysis, 25 (1). 36-40 doi:10.1002/(sici)1096-9918(199701)25:13.0.co;2-i
In(1997, January) Surface and Interface Analysis Vol. 25 (1) Wiley

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Schöpke, A., Kelling, S. (1997) Refined Approach to PCA-assisted Auger Depth Profile Analysis. Surface and Interface Analysis, 25 (1). 5-9 doi:10.1002/(sici)1096-9918(199701)25:1<5::aid-sia197>3.0.co;2-h
Galuska, Alan A. (1997) Quantitative Surface Analysis of Ethylene-Propylene Polymers using ToF-SIMS. Surface and Interface Analysis, 25 (1). 1-4 doi:10.1002/(sici)1096-9918(199701)25:1<1::aid-sia188>3.0.co;2-r
Carter, G. (1997) Viscoelastic buckling and plastic flow?deterministic mechanisms for ripple initiation on ion-bombarded amorphous solids. Surface and Interface Analysis, 25 (12). 952-955 doi:10.1002/(sici)1096-9918(199711)25:12<952::aid-sia333>3.0.co;2-f
Vreugdenhil, F., Hagenhoff, B., Zalm, P. C. (1997) X-ray-induced Metal Reduction in Polymer Hosts. Surface and Interface Analysis, 25 (1). 46-49 doi:10.1002/(sici)1096-9918(199701)25:1<46::aid-sia208>3.0.co;2-v
Vanden Eynde, X., Weng, L. T., Bertrand, P. (1997) Influence of Tacticity on Polymer Surfaces Studiedby ToF-SIMS. Surface and Interface Analysis, 25 (1). 41-45 doi:10.1002/(sici)1096-9918(199701)25:1<41::aid-sia211>3.0.co;2-t
Takeichi, Y., Goto, K. (1997) True Auger Electron Spectra Measured with a Novel Cylindrical Mirror Analyser (Au, Ag and Cu). Surface and Interface Analysis, 25 (1). 17-24 doi:10.1002/(sici)1096-9918(199701)25:1<17::aid-sia206>3.0.co;2-0
Thurgate, S. M., Lund, C. P. (1997) Comparison of the Auger Photoelectron Coincidence Spectroscopy (APECS) Spectra of Ag and InP with Cu and GaAs. Surface and Interface Analysis, 25 (1). 10-16 doi:10.1002/(sici)1096-9918(199701)25:1<10::aid-sia201>3.0.co;2-#
Tanuma, S., Powell, C. J., Penn, D. R. (1997) Calculations of Electron Inelastic Mean Free Paths (IMFPs)VI. Analysis of the Gries Inelastic Scattering Model and Predictive IMFP Equation. Surface and Interface Analysis, 25 (1). 25-35 doi:10.1002/(sici)1096-9918(199701)25:1<25::aid-sia207>3.0.co;2-2
Vajo, John J. (1997) Effects of Sample Cooling on Depth Profiling of Na in SiO2 Thin Films. Surface and Interface Analysis, 25 (4). 295-298 doi:10.1002/(sici)1096-9918(199704)25:4<295::aid-sia237>3.0.co;2-u
Seki, S., Sumiya, H., Muto, K., Tamura, H. (1997) Depth Profiling by Combined SIMS-ESDMS Analysis: a New Surface Analytical Technique. Surface and Interface Analysis, 25 (3). 155-160 doi:10.1002/(sici)1096-9918(199703)25:3<155::aid-sia216>3.0.co;2-9
GRANT, JOHN T. (1997) Preface. Surface and Interface Analysis, 25 (2). doi:10.1002/(sici)1096-9918(199702)25:23.0.co;2-z
 
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