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Tanuma, S., Powell, C. J., Penn, D. R. (1997) Calculations of Electron Inelastic Mean Free Paths (IMFPs)VI. Analysis of the Gries Inelastic Scattering Model and Predictive IMFP Equation. Surface and Interface Analysis, 25 (1). 25-35 doi:10.1002/(sici)1096-9918(199701)25:1<25::aid-sia207>3.0.co;2-2

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Reference TypeJournal (article/letter/editorial)
TitleCalculations of Electron Inelastic Mean Free Paths (IMFPs)VI. Analysis of the Gries Inelastic Scattering Model and Predictive IMFP Equation
JournalSurface and Interface Analysis
AuthorsTanuma, S.Author
Powell, C. J.Author
Penn, D. R.Author
Year1997 (January)Volume25
Issue1
PublisherWiley
DOIdoi:10.1002/(sici)1096-9918(199701)25:1<25::aid-sia207>3.0.co;2-2Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6505656Long-form Identifiermindat:1:5:6505656:1
GUID0
Full ReferenceTanuma, S., Powell, C. J., Penn, D. R. (1997) Calculations of Electron Inelastic Mean Free Paths (IMFPs)VI. Analysis of the Gries Inelastic Scattering Model and Predictive IMFP Equation. Surface and Interface Analysis, 25 (1). 25-35 doi:10.1002/(sici)1096-9918(199701)25:1<25::aid-sia207>3.0.co;2-2
Plain TextTanuma, S., Powell, C. J., Penn, D. R. (1997) Calculations of Electron Inelastic Mean Free Paths (IMFPs)VI. Analysis of the Gries Inelastic Scattering Model and Predictive IMFP Equation. Surface and Interface Analysis, 25 (1). 25-35 doi:10.1002/(sici)1096-9918(199701)25:13.0.co;2-2
In(1997, January) Surface and Interface Analysis Vol. 25 (1) Wiley

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Tanuma, S., Powell, C. J., Penn, D. R. (2003) Calculation of electron inelastic mean free paths (IMFPs) VII. Reliability of the TPP-2M IMFP predictive equation. Surface and Interface Analysis, 35 (3). 268-275 doi:10.1002/sia.1526
Tanuma, S., Powell, C. J., Penn, D. R. (1993) Calculations of electron inelastic mean free paths (IMFPS). IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV. Surface and Interface Analysis, 20 (1). 77-89 doi:10.1002/sia.740200112
Tanuma, S., Powell, C. J., Penn, D. R. (2005) Calculations of electron inelastic mean free paths. Surface and Interface Analysis, 37 (1). 1-14 doi:10.1002/sia.1997
Jablonski, Aleksander, Tanuma, Shigeo, Powell, Cedric J. (2023) Calculations of electron inelastic mean free paths (IMFPs) XIV. Calculated IMFPs for LiF and Si3N4 and development of an improved predictive IMFP formula. Surface and Interface Analysis, 55 (8) 609-637 doi:10.1002/sia.7217
Tanuma, S., Powell, C. J., Penn, D. R. (1988) Calculations of electron inelastic mean free paths for 31 materials. Surface and Interface Analysis, 11 (11). 577-589 doi:10.1002/sia.740111107
Gries, W. H. (1996) A Universal Predictive Equation for the Inelastic Mean Free Pathlengths of X-ray Photoelectrons and Auger Electrons. Surface and Interface Analysis, 24 (1). 38-50 doi:10.1002/(sici)1096-9918(199601)24:1<38::aid-sia84>3.0.co;2-h
Galuska, Alan A. (1997) Quantitative Surface Analysis of Ethylene-Propylene Polymers using ToF-SIMS. Surface and Interface Analysis, 25 (1). 1-4 doi:10.1002/(sici)1096-9918(199701)25:1<1::aid-sia188>3.0.co;2-r
Tougaard, Sven (1997) Universality Classes of Inelastic Electron Scattering Cross-sections. Surface and Interface Analysis, 25 (3). 137-154 doi:10.1002/(sici)1096-9918(199703)25:3<137::aid-sia230>3.0.co;2-l
Powell, C. J., Jablonski, A. (2000) Evaluation of electron inelastic mean free paths for selected elements and compounds. Surface and Interface Analysis, 29 (2). 108-114 doi:10.1002/(sici)1096-9918(200002)29:2<108::aid-sia700>3.0.co;2-4
Schöpke, A., Kelling, S. (1997) Refined Approach to PCA-assisted Auger Depth Profile Analysis. Surface and Interface Analysis, 25 (1). 5-9 doi:10.1002/(sici)1096-9918(199701)25:1<5::aid-sia197>3.0.co;2-h
Carter, G. (1997) Viscoelastic Relaxation and Sputter-depth Profiling of Amorphous Materials. Surface and Interface Analysis, 25 (1). 36-40 doi:10.1002/(sici)1096-9918(199701)25:1<36::aid-sia210>3.0.co;2-i
 
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