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George, I., Viel, P., Bureau, C., Suski, J., L�cayon, G. (1996) Study of the Silicon/?-APS/Pyralin Assembly Interfaces by X-ray Photoelectron Spectroscopy. Surface and Interface Analysis, 24 (11). 774-780 doi:10.1002/(sici)1096-9918(199610)24:11<774::aid-sia180>3.0.co;2-x

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Reference TypeJournal (article/letter/editorial)
TitleStudy of the Silicon/?-APS/Pyralin Assembly Interfaces by X-ray Photoelectron Spectroscopy
JournalSurface and Interface Analysis
AuthorsGeorge, I.Author
Viel, P.Author
Bureau, C.Author
Suski, J.Author
L�cayon, G.Author
Year1996 (October)Volume24
Issue11
PublisherWiley
DOIdoi:10.1002/(sici)1096-9918(199610)24:11<774::aid-sia180>3.0.co;2-xSearch in ResearchGate
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Mindat Ref. ID6505352Long-form Identifiermindat:1:5:6505352:8
GUID0
Full ReferenceGeorge, I., Viel, P., Bureau, C., Suski, J., L�cayon, G. (1996) Study of the Silicon/?-APS/Pyralin Assembly Interfaces by X-ray Photoelectron Spectroscopy. Surface and Interface Analysis, 24 (11). 774-780 doi:10.1002/(sici)1096-9918(199610)24:11<774::aid-sia180>3.0.co;2-x
Plain TextGeorge, I., Viel, P., Bureau, C., Suski, J., L�cayon, G. (1996) Study of the Silicon/?-APS/Pyralin Assembly Interfaces by X-ray Photoelectron Spectroscopy. Surface and Interface Analysis, 24 (11). 774-780 doi:10.1002/(sici)1096-9918(199610)24:113.0.co;2-x
In(1996, October) Surface and Interface Analysis Vol. 24 (11) Wiley

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