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Gilmore, I. S., Seah, M. P. (1996) Static SIMS: A Study of Damage Using Polymers. Surface and Interface Analysis, 24 (11). 746-762 doi:10.1002/(sici)1096-9918(199610)24:11<746::aid-sia177>3.0.co;2-a

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Reference TypeJournal (article/letter/editorial)
TitleStatic SIMS: A Study of Damage Using Polymers
JournalSurface and Interface Analysis
AuthorsGilmore, I. S.Author
Seah, M. P.Author
Year1996 (October)Volume24
Issue11
PublisherWiley
DOIdoi:10.1002/(sici)1096-9918(199610)24:11<746::aid-sia177>3.0.co;2-aSearch in ResearchGate
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Mindat Ref. ID6505347Long-form Identifiermindat:1:5:6505347:6
GUID0
Full ReferenceGilmore, I. S., Seah, M. P. (1996) Static SIMS: A Study of Damage Using Polymers. Surface and Interface Analysis, 24 (11). 746-762 doi:10.1002/(sici)1096-9918(199610)24:11<746::aid-sia177>3.0.co;2-a
Plain TextGilmore, I. S., Seah, M. P. (1996) Static SIMS: A Study of Damage Using Polymers. Surface and Interface Analysis, 24 (11). 746-762 doi:10.1002/(sici)1096-9918(199610)24:113.0.co;2-a
In(1996, October) Surface and Interface Analysis Vol. 24 (11) Wiley

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Jablonski, A., Jiricek, P. (1996) Elastic Electron Backscattering from Surfaces at Low Energies. Surface and Interface Analysis, 24 (11). 781-785 doi:10.1002/(sici)1096-9918(199610)24:11<781::aid-sia187>3.0.co;2-k
Gilmore, I. S., Seah, M. P. (2000) Static SIMS inter-laboratory study. Surface and Interface Analysis, 29 (9). 624-637 doi:10.1002/1096-9918(200009)29:9<624::aid-sia908>3.0.co;2-f
Gautier, B., Prost, R., Prudon, G., Dupuy, J. C. (1996) Deconvolution of SIMS Depth Profiles of Boron in Silicon. Surface and Interface Analysis, 24 (11). 733-745 doi:10.1002/(sici)1096-9918(199610)24:11<733::aid-sia173>3.0.co;2-w
Hautaniemi, J. A., Heinonen, M., Juhanoja, J. (1996) Oxidation Study of Dental Metal-Ceramic Alloys by Surface Characterization Techniques. Part 2. Pd Alloys. Surface and Interface Analysis, 24 (11). 763-773 doi:10.1002/(sici)1096-9918(199610)24:11<763::aid-sia178>3.0.co;2-e
Seah, M. P., Gilmore, I. S. (1998) Quantitative AES VII. The ionization cross-section in AES. Surface and Interface Analysis, 26 (11). 815-824 doi:10.1002/(sici)1096-9918(199810)26:11<815::aid-sia427>3.0.co;2-1
George, I., Viel, P., Bureau, C., Suski, J., L�cayon, G. (1996) Study of the Silicon/?-APS/Pyralin Assembly Interfaces by X-ray Photoelectron Spectroscopy. Surface and Interface Analysis, 24 (11). 774-780 doi:10.1002/(sici)1096-9918(199610)24:11<774::aid-sia180>3.0.co;2-x
Galuska, Alan (1996) Surface Characterization of EMA Copolymers Using XPS and ToF-SIMS. Surface and Interface Analysis, 24 (6). 380-388 doi:10.1002/(sici)1096-9918(199606)24:6<380::aid-sia128>3.0.co;2-3
Gnaser, Hubert (1996) Towards a 3D Characterization of Solids by MCs+ SIMS. Surface and Interface Analysis, 24 (8). 483-489 doi:10.1002/(sici)1096-9918(199608)24:8<483::aid-sia141>3.0.co;2-2
Cumpson, P. J., Seah, M. P., Spencer, S. J. (1996) Simple Procedure for Precise Peak Maximum Estimation for Energy Calibration inAES andXPS. Surface and Interface Analysis, 24 (10). 687-694 doi:10.1002/(sici)1096-9918(19960930)24:10<687::aid-sia174>3.0.co;2-q
Seah, M. P. (1996) Quantitative AES IV: Accuracy of the Numerical Evaluation of Peak Areas in AES using the Universal Tongaard Background Subtraction Method. Surface and Interface Analysis, 24 (12). 830-838 doi:10.1002/(sici)1096-9918(199611)24:12<830::aid-sia196>3.0.co;2-l
Seah, M. P., Gilmore, I. S. (1998) Quantitative AES. VIII: analysis of auger electron intensities from elemental data in a digital auger database. Surface and Interface Analysis, 26 (12). 908-929 doi:10.1002/(sici)1096-9918(199811)26:12<908::aid-sia438>3.0.co;2-h
 
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