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Gilmore, I. S., Seah, M. P. (1995) Fluence, flux, current and current density measurement in faraday cups for surface analysis. Surface and Interface Analysis, 23 (4). 248-258 doi:10.1002/sia.740230409

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Reference TypeJournal (article/letter/editorial)
TitleFluence, flux, current and current density measurement in faraday cups for surface analysis
JournalSurface and Interface Analysis
AuthorsGilmore, I. S.Author
Seah, M. P.Author
Year1995 (April)Volume23
Issue4
PublisherWiley
DOIdoi:10.1002/sia.740230409Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6505156Long-form Identifiermindat:1:5:6505156:6
GUID0
Full ReferenceGilmore, I. S., Seah, M. P. (1995) Fluence, flux, current and current density measurement in faraday cups for surface analysis. Surface and Interface Analysis, 23 (4). 248-258 doi:10.1002/sia.740230409
Plain TextGilmore, I. S., Seah, M. P. (1995) Fluence, flux, current and current density measurement in faraday cups for surface analysis. Surface and Interface Analysis, 23 (4). 248-258 doi:10.1002/sia.740230409
In(1995, April) Surface and Interface Analysis Vol. 23 (4) Wiley

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Gilmore, I. S., Seah, M. P. (1995) Static SIMS: Surface charge stabilization of insulators for highly repeatable spectra when using a quadrupole mass spectrometer. Surface and Interface Analysis, 23 (4). 191-203 doi:10.1002/sia.740230402
Gilmore, Ian S. (2022) Martin P Seah MBE—Shining a light on surface chemical analysis. Surface and Interface Analysis, 54 (4) 282-284 doi:10.1002/sia.7071
Lee, J. L. S., Tyler, B. J., Wagner, M. S., Gilmore, I. S., Seah, M. P. (2009) The development of standards and guides for multivariate analysis in surface chemical analysis. Surface and Interface Analysis, 41 (2). 76-78 doi:10.1002/sia.2935
Lee, J. L. S., Gilmore, I. S., Fletcher, I. W., Seah, M. P. (2009) Multivariate image analysis strategies for ToF-SIMS images with topography. Surface and Interface Analysis, 41 (8). 653-665 doi:10.1002/sia.3070
Lee, J. L. S., Gilmore, I. S., Seah, M. P. (2008) Quantification and methodology issues in multivariate analysis of ToF-SIMS data for mixed organic systems. Surface and Interface Analysis, 40 (1). 1-14 doi:10.1002/sia.2713
Seah, M. P. (1995) Effective dead time in pulse counting systems. Surface and Interface Analysis, 23 (10). 729-732 doi:10.1002/sia.740231013
Seah, M. P., Gilmore, I. S. (2011) Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMS. Surface and Interface Analysis, 43 (1). 228-235 doi:10.1002/sia.3491
Seah, M. P., Gilmore, I. S. (2001) Simplified equations for correction parameters for elastic scattering effects in AES and XPS forQ, ? and attenuation lengths. Surface and Interface Analysis, 31 (9). 835-846 doi:10.1002/sia.1113
Seah, M. P., Clifford, C. A., Green, F. M., Gilmore, I. S. (2005) An accurate semi-empirical equation for sputtering yields I: for argon ions. Surface and Interface Analysis, 37 (5). 444-458 doi:10.1002/sia.2032
Gilmore, I. S., Seah, M. P., Henderson, A. (2004) Summary of ISO/TC 201 standard: XXII. ISO 22048:2004?Surface chemical analysis?Information format for static secondary ion mass spectrometry. Surface and Interface Analysis, 36 (13). 1642-1644 doi:10.1002/sia.2001
Salter, T. L., Green, F. M., Gilmore, I. S., Seah, M. P., Stokes, P. (2011) A comparison of SIMS and DESI and their complementarities. Surface and Interface Analysis, 43 (1). 294-297 doi:10.1002/sia.3412
 
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