Petkov, K., Krastev, V., Marinova, Ts. (1994) XPS study of amorphous As2S3 films deposited onto chromium layers. Surface and Interface Analysis, 22 (1). 202-205 doi:10.1002/sia.740220145

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Reference Type	Journal (article/letter/editorial)
Title	XPS study of amorphous As2S3 films deposited onto chromium layers
Journal	Surface and Interface Analysis
Authors	Petkov, K.		Author
	Krastev, V.		Author
	Marinova, Ts.		Author
Year	1994 (July)	Volume	22
Issue	1
Publisher	Wiley
DOI	doi:10.1002/sia.740220145Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	6504867	Long-form Identifier	mindat:1:5:6504867:8
GUID	0
Full Reference	Petkov, K., Krastev, V., Marinova, Ts. (1994) XPS study of amorphous As2S3 films deposited onto chromium layers. Surface and Interface Analysis, 22 (1). 202-205 doi:10.1002/sia.740220145
Plain Text	Petkov, K., Krastev, V., Marinova, Ts. (1994) XPS study of amorphous As2S3 films deposited onto chromium layers. Surface and Interface Analysis, 22 (1). 202-205 doi:10.1002/sia.740220145
In	(1994, July) Surface and Interface Analysis Vol. 22 (1) Wiley

	*Petkov, K., Krastev, V., Marinova, Ts. (1992) XPS analysis of thin chromium films. Surface and Interface Analysis, 18 (7). 487-490 doi:10.1002/sia.740180705*
	Krastev, V., Marinova, Ts., Karpuzov, D., Kalitzova, M., Vitali, G., Rossi, M. (1993) XPS study of laser-annealed ion-implanted GaAs. Surface and Interface Analysis, 20 (12). 955-958 doi:10.1002/sia.740201205
	*Mihailova, Ts., Velchev, N., Krastev, V., Marinova, Ts. (1997) XPS study of residual oxide layers on p-GaAs surfaces. Applied Surface Science, 120. 213-219 doi:10.1016/s0169-4332(97)00249-3*
	Marinova, Ts., Krastev, V., Hallin, Christer, Yakimova, Rositza, Janzén, Erik (1996) XPS Study of Ni Layers Deposited on 6H-SiC. Materials Science Forum, 207. 293-296 doi:10.4028/www.scientific.net/msf.207-209.293
	Stefanov, P., Atanasova, G., Robinson, K., Julbe, A., Guizard, C., O'Hara, P., Marinova, Ts. (2002) Characterization of thin Co/ZrO2 catalytic films by XPS, SEM and SAM. Surface and Interface Analysis, 34 (1). 84-87 doi:10.1002/sia.1258
	Toneva, A., Nenova, Z., Marinova, Ts., Krastev, V. (1997) X-ray photoelectron spectroscopy study of post-hydrogenated homogeneous chemically vapour-deposited amorphous silicon films. Philosophical Magazine A, 75 (2). 331-339 doi:10.1080/01418619708205145
	Garbassi, F., Morra, M., Occhiello, E., Pozzi, L. (1994) The use of XPS valence band spectra in the study of plasma-deposited polymeric films of tetramethyldisiloxane or hydroxyethylmethacrylate. Surface and Interface Analysis, 22 (1). 485-490 doi:10.1002/sia.7402201103
	Arezzo, F., Severini, E., Zacchetti, N. (1994) An XPS study of diamond films grown on differently pretreated silicon substrates. Surface and Interface Analysis, 22 (1). 218-223 doi:10.1002/sia.740220149
	*Ciampi, S., Di Castro, V. (1994) The influence of Al oxidation on the Cu/Al2O3 interface formation: An XPS study. Surface and Interface Analysis, 22 (1). 594-597 doi:10.1002/sia.7402201126*
	Jeske, M., Jung, K. G., Schultze, J. W., Thönissen, M., Münder, H. (1994) XPS investigations of electrochemically modified porous silicon layers. Surface and Interface Analysis, 22 (1). 363-366 doi:10.1002/sia.740220179
	*Toneva, A, Marinova, Ts, Krastev, V (1998) XPS investigation of a-Si:H thin films after light soaking. Journal of Luminescence, 80 (1) 455-459 doi:10.1016/s0022-2313(98)00147-1*

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Petkov, K., Krastev, V., Marinova, Ts. (1994) XPS study of amorphous As2S3 films deposited onto chromium layers. Surface and Interface Analysis, 22 (1). 202-205 doi:10.1002/sia.740220145

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