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Watton, H. L. L., Fitzgerald, A. G., Moir, P. A. (1991) Composition of thin surface layers obtained by X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (6). 320-324 doi:10.1002/sia.740170605

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Reference TypeJournal (article/letter/editorial)
TitleComposition of thin surface layers obtained by X-ray photoelectron spectroscopy
JournalSurface and Interface Analysis
AuthorsWatton, H. L. L.Author
Fitzgerald, A. G.Author
Moir, P. A.Author
Year1991 (June)Volume17
Issue6
PublisherWiley
DOIdoi:10.1002/sia.740170605Search in ResearchGate
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Mindat Ref. ID6503198Long-form Identifiermindat:1:5:6503198:8
GUID0
Full ReferenceWatton, H. L. L., Fitzgerald, A. G., Moir, P. A. (1991) Composition of thin surface layers obtained by X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (6). 320-324 doi:10.1002/sia.740170605
Plain TextWatton, H. L. L., Fitzgerald, A. G., Moir, P. A. (1991) Composition of thin surface layers obtained by X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (6). 320-324 doi:10.1002/sia.740170605
In(1991, June) Surface and Interface Analysis Vol. 17 (6) Wiley

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Fitzgerald, A. G., Gillies, A. D., Watton, H. L. L. (1990) A comparison of the composition of thin films on substrates determined by EDX and surface analysis. Surface and Interface Analysis, 16 (1). 163-167 doi:10.1002/sia.740160132
Fitzgerald, A. G., Watton, H. L. L., Storey, B. E., Colligon, J. S., Kheyrandish, H. (1994) Computer programs for surface analysis by SIMS and SNMS. Surface and Interface Analysis, 22 (1). 69-74 doi:10.1002/sia.740220118
Mauron, R., Nowak, S., Dietler, G., Schalaphach, L. (1991) Effects of polymer surface treatment on metal/polymer interfaces studies by X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (7). 535-537 doi:10.1002/sia.740170724
Bishop, H. E. (1991) The effects of photoelectron diffraction on quantitative X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (4). 197-202 doi:10.1002/sia.740170406
Nefedov, V. I. (1981) X-ray photoelectron analysis of surface layers with composition gradients. Surface and Interface Analysis, 3 (2). 72-75 doi:10.1002/sia.740030203
Stevens, Joanna S., Schroeder, Sven L. M. (2009) Quantitative analysis of saccharides by X-ray photoelectron spectroscopy. Surface and Interface Analysis, 41 (6). 453-462 doi:10.1002/sia.3047
Evans, Stephen (1991) Curve synthesis and optimization procedures for X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (2). 85-93 doi:10.1002/sia.740170204
Fitzgerald, A. G., Watton, H. L. L., Moir, P. A. (1993) Microbeam analysis studies of the copper-silver interface. Journal of Materials Science, 28. 1819-1823 doi:10.1007/bf00595751
Fan, Y., Fitzgerald, A. G., John, P., Troupe, C. E, Wilson, J. I. B. (2002) X-ray photoelectron spectroscopy studies of CVD diamond films. Surface and Interface Analysis, 34 (1). 703-707 doi:10.1002/sia.1392
Atuchin, V. V., Kesler, V. G., Maklakova, N. Yu., Pokrovsky, L. D., Semenenko, V. N. (2002) Study of KTiOPO4 surface by x-ray photoelectron spectroscopy and reflection high-energy electron diffraction. Surface and Interface Analysis, 34 (1). 320-323 doi:10.1002/sia.1309
Moir, P. A., Fitzgerald, A. G., Storey, B. E. (1989) Computer-Aided quantification of AES and XPS spectra. Surface and Interface Analysis, 14 (6). 295-301 doi:10.1002/sia.740140605
 
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