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Evans, Stephen (1991) Curve synthesis and optimization procedures for X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (2). 85-93 doi:10.1002/sia.740170204

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Reference TypeJournal (article/letter/editorial)
TitleCurve synthesis and optimization procedures for X-ray photoelectron spectroscopy
JournalSurface and Interface Analysis
AuthorsEvans, StephenAuthor
Year1991 (February)Volume17
Issue2
PublisherWiley
DOIdoi:10.1002/sia.740170204Search in ResearchGate
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Mindat Ref. ID6503095Long-form Identifiermindat:1:5:6503095:2
GUID0
Full ReferenceEvans, Stephen (1991) Curve synthesis and optimization procedures for X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (2). 85-93 doi:10.1002/sia.740170204
Plain TextEvans, Stephen (1991) Curve synthesis and optimization procedures for X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (2). 85-93 doi:10.1002/sia.740170204
In(1991, February) Surface and Interface Analysis Vol. 17 (2) Wiley

See Also

These are possibly similar items as determined by title/reference text matching only.

Evans, Stephen (1985) Energy calibration secondary standards for X-ray photoelectron spectrometers. Surface and Interface Analysis, 7 (6). 299-302 doi:10.1002/sia.740070609
Bishop, H. E. (1991) The effects of photoelectron diffraction on quantitative X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (4). 197-202 doi:10.1002/sia.740170406
(1991) American society for testing and materials. Standard practice for reporting spectra in X-ray photoelectron spectroscopy (E1015-90). Surface and Interface Analysis, 17 (13). 959-960 doi:10.1002/sia.740171309
(1988) Standard guide for specimen handling in Auger electron spectroscopy and X-ray photoelectron spectroscopy (E1078-85). Surface and Interface Analysis, 11 (1). 119-124 doi:10.1002/sia.740110118
Kövér, L. (2006) Summary of ISO/TC201 technical report: ISO/TR 18392: 2005—Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds. Surface and Interface Analysis, 38 (7). 1173-1175 doi:10.1002/sia.2365
Murdoch, Billy J. (2026) Quantitative Analysis Using Dual Anode X‐Ray Photoelectron Spectroscopy. Surface and Interface Analysis, 58 (2). doi:10.1002/sia.70039
(1991) American society for testing and materials. Standard guide for specimen handling in Auger electron spectroscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry (E1078-90). Surface and Interface Analysis, 17 (13). 965-971 doi:10.1002/sia.740171311
Ash, Lynne A., Evans, Stephen (1993) X-ray photoelectron diffraction studies of the surface chemistry of non-stoichiometric synthetic spinel. Surface and Interface Analysis, 20 (13). 1075-1080 doi:10.1002/sia.740201308
Moeini, Behnam, Gallagher, Neal, Linford, Matthew R. (2023) Surface analysis insight note: Multivariate curve resolution of an X‐ray photoelectron spectroscopy image. Surface and Interface Analysis, 55 (12) 853-858 doi:10.1002/sia.7260
Watton, H. L. L., Fitzgerald, A. G., Moir, P. A. (1991) Composition of thin surface layers obtained by X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (6). 320-324 doi:10.1002/sia.740170605
Sian Crawford, E., Evans, Stephen, Raftery, Elizabeth, Scott, Michael D. (1983) X-ray photoelectron diffraction studies of zinc selenide. Surface and Interface Analysis, 5 (1). 28-32 doi:10.1002/sia.740050107
 
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