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Bernstein, R. W., Grepstad, J. K. (1989) XPS intensity analysis for assessment of thickness and composition of thin overlayer films: Application to chemically etched GaAs(100) surfaces. Surface and Interface Analysis, 14 (3). 109-114 doi:10.1002/sia.740140303

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Reference TypeJournal (article/letter/editorial)
TitleXPS intensity analysis for assessment of thickness and composition of thin overlayer films: Application to chemically etched GaAs(100) surfaces
JournalSurface and Interface Analysis
AuthorsBernstein, R. W.Author
Grepstad, J. K.Author
Year1989 (March)Volume14
Issue3
PublisherWiley
DOIdoi:10.1002/sia.740140303Search in ResearchGate
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Mindat Ref. ID6502138Long-form Identifiermindat:1:5:6502138:9
GUID0
Full ReferenceBernstein, R. W., Grepstad, J. K. (1989) XPS intensity analysis for assessment of thickness and composition of thin overlayer films: Application to chemically etched GaAs(100) surfaces. Surface and Interface Analysis, 14 (3). 109-114 doi:10.1002/sia.740140303
Plain TextBernstein, R. W., Grepstad, J. K. (1989) XPS intensity analysis for assessment of thickness and composition of thin overlayer films: Application to chemically etched GaAs(100) surfaces. Surface and Interface Analysis, 14 (3). 109-114 doi:10.1002/sia.740140303
In(1989, March) Surface and Interface Analysis Vol. 14 (3) Wiley

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Sullivan, J. L., Yu, W., Saied, S. O. (1994) ARXPS and LEISS characterizations for chemically etched and ion-bombarded GaAs(100) surfaces. Surface and Interface Analysis, 22 (1). 515-519 doi:10.1002/sia.7402201109
Jablonski, A., Zemek, J. (2009) Overlayer thickness determination by XPS using the multiline approach. Surface and Interface Analysis, 41 (3). 193-204 doi:10.1002/sia.3005
Mohai, M., Bertóti, I. (2004) Calculation of overlayer thickness on curved surfaces based on XPS intensities. Surface and Interface Analysis, 36 (8). 805-808 doi:10.1002/sia.1769
Carin, R., Deville, J. P., Werckmann, J. (1990) An XPS study of GaN thin films on GaAs. Surface and Interface Analysis, 16 (1). 65-69 doi:10.1002/sia.740160116
Hallam, K. R., Wild, R. K. (1995) XPS analysis of metal grain boundary surfaces. Surface and Interface Analysis, 23 (3). 133-136 doi:10.1002/sia.740230303
Mohai, M., Bertóti, I. (2012) Calculation of layer thickness on nanotube surfaces from XPS intensity data. Surface and Interface Analysis, 44 (8). 1130-1134 doi:10.1002/sia.4864
Swami, G. T. K. (1989) Variable angle XPS investigation of lubricant films coated on sputtered carbon. Surface and Interface Analysis, 14 (1). 3-6 doi:10.1002/sia.740140103
Bender, H., Portillo, J., Vandervorst, W. (1989) Quantitative AES and XPS investigation of magnetron sputtered TiNx films. Surface and Interface Analysis, 14 (6). 337-346 doi:10.1002/sia.740140610
Shard, A. G., Wang, J., Spencer, S. J. (2009) XPS topofactors: determining overlayer thickness on particles and fibres. Surface and Interface Analysis, 41 (7). 541-548 doi:10.1002/sia.3044
Allgeyer, Daniel F., Pratz, Earl H. (1992) XPS analysis of thin oxide films on chemically treated aluminum alloy surfaces using a high-energy Mg/Zr anode. Surface and Interface Analysis, 18 (7). 465-474 doi:10.1002/sia.740180702
Grant, J. T. (1989) Methods for quantitative analysis in XPS and AES. Surface and Interface Analysis, 14 (6). 271-283 doi:10.1002/sia.740140602
 
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