Williams, Thomas J. (2006) Scanning electron microscopy and x-ray microanalysis, 3rd edition. By Joseph Goldstein, Dale Newbury, David Joy, Charles Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, Joseph Michael Kluwer Academic Publishers, New York (2003) ISBN 0306472929; hardbac. Scanning, 27 (4). 215-216 doi:10.1002/sca.4950270410

See Also

These are possibly similar items as determined by title/reference text matching only.

	Burany, Sandy (2003) Scanning Electron Microscopy and X-Ray Microanalysis. J. Goldstein, D. Newbury, D. Joy, C, Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael. Kluwer Academic, Plenum Publishers, New York; 2003, 688 pages (Hardback, $75.00) ISBN 0-306-47292-9. Microscopy and Microanalysis, 9 (5). 484 doi:10.1017/s1431927603030617
	Pearce, R. B. (2003) GOLDSTEIN, J., NEWBURY, D., JOY, D., LYMAN, C., ECHLIN, P., LIFSHIN, E., SAWYER, L. & MICHAEL, J. 2003. Scanning Electron Microscopy and X-Ray Microanalysis, 3rd ed. xix + 689 pp. New York, Boston, Dordrecht, London, Moscow: Kluwer Academic/Plenum Publishers. Price Euros 76.00, US $75.00, £48.00 (hard covers) ISBN 0 306 47292 9. Geological Magazine, 140 (6) 728-729 doi:10.1017/s0016756803238838
	Cleaver, C. Gordon (1993) Scanning electron microscopy, x-ray microanalysis and analytical electron microscopy a laboratory workbook. Charles E. Lyman, Dale E. Newbury, Joseph I. Goldstein, David B. Williams, Alton D. Romig, Jr., John T. Armstron, Patrick Echlin, Charles E. Fiori,. Scanning, 15 (1). 51 doi:10.1002/sca.4950150110
	Panessa-Warren, B. (1983) Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists.Joseph I. Goldstein , Dale E. Newbury , Patrick Echlin , David C. Joy , Charles Fiori , Eric Lifshin. The Quarterly Review of Biology, 58 (3). 484-485 doi:10.1086/413540
	Mochel, M. E., Dümler, I., Greene, A., Eades, J. A. (1991) Scanning electron microscopy, X-ray microanalysis, and analytical electron microscopy. A laboratory workbook, By Charles E. Lyman, Dale E. Newbury, Joseph I. Goldstein, David B. Williams, Alton D. Romig Jr., John T. Armstrong, Patrick Echlin, Charles E. F. Journal of Electron Microscopy Technique, 19 (3). 379 doi:10.1002/jemt.1060190312
	Heuer, James P. (1992) Advanced scanning electron microscopy and X-ray microanalysis by D.E. Newbury, D.C. Joy, P. Echlin, C.E. Fiori, and J.I. Goldstein Plenum Press, New York (1986) ISBN 0-036-42140-2; 454 pages. Scanning, 14 (6). 365 doi:10.1002/sca.4950140611
	Giannuzzi, Lucille A. (2018) Scanning Electron Microscopy and X-Ray Microanalysis 4th Edition, Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy, Springer, 2018, 550 pp. ISBN:978-1-4939-6674-5. Microscopy and Microanalysis, 24 (6). 768 doi:10.1017/s1431927618015271
	Allard, Lawrence F. (2006) Electron microscopy of nanotubes. By L. Wang and C. Hui, Kluwer Academic Publishers, New York, 2003 ISBN 01-40207-361-5; hard cover, 328 pages, $253.00. Scanning, 26 (6). 318 doi:10.1002/sca.4950260609
	Buckley, Andy (1993) J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, A. D. RomigJr, C. E. Lyman, C. Fiori & E. Lifshin 1992. Scanning Electron Microscopy and X-Ray Microanalysis. A Text for Biologists, Materials Scientists, and Geologists, 2nd ed. xviii + 820 pp. New York, London: Plenum Press. Price US $49.50 (hard covers) ISBN 0 306 44175 6. Geological Magazine, 130 (3) 402-403 doi:10.1017/s0016756800020276
	S. J. B. R., (1982) J. I. Golstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori & E. Lifshin 1981. Scanning Electron Microscopy and X-Ray Microanalysis. xiii + 673 pp., numerous illustrations. New York, London: Plenum. Price U.S. $29.50 (U.S.A.); plus 20% elsewhere. ISBN 0 306 40768 X. Geological Magazine, 119 (6) 637-638 doi:10.1017/s0016756800027199
	S. J. B. R., (1986) D. E. Newbury, D. C. Joy, P. Echlin, C. E. Fiori & J. I. Goldstein 1986. Advanced Scanning Electron Microscopy and X-Ray Microanalysis. xii + 45 pp. New York, London: Plenum Press. Price US $37.50 (hard covers) ISBN 0 306 42140 2. Geological Magazine, 123 (6) 709 doi:10.1017/s0016756800024298