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Allard, Lawrence F. (2006) Electron microscopy of nanotubes. By L. Wang and C. Hui, Kluwer Academic Publishers, New York, 2003 ISBN 01-40207-361-5; hard cover, 328 pages, $253.00. Scanning, 26 (6). 318 doi:10.1002/sca.4950260609

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Reference TypeJournal (article/letter/editorial)
TitleElectron microscopy of nanotubes. By L. Wang and C. Hui, Kluwer Academic Publishers, New York, 2003 ISBN 01-40207-361-5; hard cover, 328 pages, $253.00
JournalScanning
AuthorsAllard, Lawrence F.Author
Year2006 (December 6)Volume26
Issue6
PublisherWiley
DOIdoi:10.1002/sca.4950260609Search in ResearchGate
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Mindat Ref. ID6445930Long-form Identifiermindat:1:5:6445930:9
GUID0
Full ReferenceAllard, Lawrence F. (2006) Electron microscopy of nanotubes. By L. Wang and C. Hui, Kluwer Academic Publishers, New York, 2003 ISBN 01-40207-361-5; hard cover, 328 pages, $253.00. Scanning, 26 (6). 318 doi:10.1002/sca.4950260609
Plain TextAllard, Lawrence F. (2006) Electron microscopy of nanotubes. By L. Wang and C. Hui, Kluwer Academic Publishers, New York, 2003 ISBN 01-40207-361-5; hard cover, 328 pages, $253.00. Scanning, 26 (6). 318 doi:10.1002/sca.4950260609
In(2006, December) Scanning Vol. 26 (6) Wiley

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Robertson, Ian M. (2006) In situ microscopy in materials research Edited by Prathiba L. Gai Kluwer Academic Publishers, Dordrecht, (1997) ISBN 0-7923-9989-7, 352 pages, $168.00 U.S. Scanning, 20 (8). 592 doi:10.1002/sca.4950200809
Burany, Sandy (2003) Scanning Electron Microscopy and X-Ray Microanalysis. J. Goldstein, D. Newbury, D. Joy, C, Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael. Kluwer Academic, Plenum Publishers, New York; 2003, 688 pages (Hardback, $75.00) ISBN 0-306-47292-9. Microscopy and Microanalysis, 9 (5). 484 doi:10.1017/s1431927603030617
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Pearce, R. B. (2003) GOLDSTEIN, J., NEWBURY, D., JOY, D., LYMAN, C., ECHLIN, P., LIFSHIN, E., SAWYER, L. & MICHAEL, J. 2003. Scanning Electron Microscopy and X-Ray Microanalysis, 3rd ed. xix + 689 pp. New York, Boston, Dordrecht, London, Moscow: Kluwer Academic/Plenum Publishers. Price Euros 76.00, US $75.00, £48.00 (hard covers) ISBN 0 306 47292 9. Geological Magazine, 140 (6) 728-729 doi:10.1017/s0016756803238838
Burge, R. E. (1981) Computer techniques for image processing in electron microscopy by W. O. Saxton Academic Press Inc., New York 1978 289 pages, £ 27.00 ISBN 0-12-014570-7. Scanning, 4 (3). 159-160 doi:10.1002/sca.4950040309
Newbury, Dale E. (1992) Electron and ion microscopy and microanalysis principles and applications, 2nd ed., revised and expanded by Lawrence E. Murr Marcel Dekker, New York (1991) ISBN 08247 8556-8; 837 pages + xiv price: $195.00. Scanning, 14 (5). 302-303 doi:10.1002/sca.4950140512
Rost, By F.W.D. (2006) Fluorescence microscopy, volume II By F.W.D. Rost Cambridge University Press, Cambridge and New York (1995) ISBN 0-521-41088-6; 457 pages; $175.00. Scanning, 18 (8). 593 doi:10.1002/sca.4950180810
Boyde, A. (1980) Diagnostic electron microscopy of tumours: F. N. Ghadially: Butterworth ' Co (Publishers) Ltd., London 1980 251 pages, 195 figures, £32.00 ISBN 407-00156-5. Scanning, 3 (4). 303 doi:10.1002/sca.4950030412
Bromage, Timothy G., Kriete, Andres (2006) Complexity from microscopic to macroscopic scales: Coherence and large deviations. Proceedings of the NATO Advanced Study Institute, Vol. 63. By A. T. Skjeltorp and T. Vicsek Kluwer Academic Publishers, Dordrecht (2002) ISBN 140200633-0;hardback;230 pages. Scanning, 27 (5). 271-272 doi:10.1002/sca.4950270507
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