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Smets, A.H.M., van Helden, J.H., van de Sanden, M.C.M. (2002) Bulk and surface defects in a-Si:H films studied by means of the cavity ring down absorption technique. Journal of Non-Crystalline Solids, 299. 610-614 doi:10.1016/s0022-3093(01)01026-2

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Reference TypeJournal (article/letter/editorial)
TitleBulk and surface defects in a-Si:H films studied by means of the cavity ring down absorption technique
JournalJournal of Non-Crystalline Solids
AuthorsSmets, A.H.M.Author
van Helden, J.H.Author
van de Sanden, M.C.M.Author
Year2002 (April)Volume299
PublisherElsevier BV
DOIdoi:10.1016/s0022-3093(01)01026-2Search in ResearchGate
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Mindat Ref. ID640206Long-form Identifiermindat:1:5:640206:2
GUID0
Full ReferenceSmets, A.H.M., van Helden, J.H., van de Sanden, M.C.M. (2002) Bulk and surface defects in a-Si:H films studied by means of the cavity ring down absorption technique. Journal of Non-Crystalline Solids, 299. 610-614 doi:10.1016/s0022-3093(01)01026-2
Plain TextSmets, A.H.M., van Helden, J.H., van de Sanden, M.C.M. (2002) Bulk and surface defects in a-Si:H films studied by means of the cavity ring down absorption technique. Journal of Non-Crystalline Solids, 299. 610-614 doi:10.1016/s0022-3093(01)01026-2
In(2002) Journal of Non-Crystalline Solids Vol. 299. Elsevier BV

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Brinza, M, Adriaenssens, G.J, Iakoubovskii, K, Stesmans, A, Kessels, W.M.M, Smets, A.H.M, van de Sanden, M.C.M (2002) Time-of-flight photocurrents in expanding-thermal-plasma-deposited a-Si:H. Journal of Non-Crystalline Solids, 299. 420-424 doi:10.1016/s0022-3093(01)01178-4
Kessels, W.M.M., Smets, A.H.M., van de Sanden, M.C.M. (2004) The a-Si:H growth mechanism and the role of H abstraction from the surface by SiH3 radicals via an Eley–Rideal mechanism. Journal of Non-Crystalline Solids, 338. 27-31 doi:10.1016/j.jnoncrysol.2004.02.015
Bronneberg, A.C., Smets, A.H.M., Creatore, M., van de Sanden, M.C.M. (2011) On the oxidation mechanism of microcrystalline silicon thin films studied by Fourier transform infrared spectroscopy. Journal of Non-Crystalline Solids, 357 (3) 884-887 doi:10.1016/j.jnoncrysol.2010.11.001
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Smit, C, Hamers, E.A.G, Korevaar, B.A, van Swaaij, R.A.C.M.M, van de Sanden, M.C.M (2002) Fast deposition of microcrystalline silicon with an expanding thermal plasma. Journal of Non-Crystalline Solids, 299. 98-102 doi:10.1016/s0022-3093(01)01184-x
Willekens, J., Brinza, M., Güngör, T., Adriaenssens, G.J., Nesládek, M., Kessels, W.M.M., Smets, A.H.M., van de Sanden, M.C.M. (2004) Optical spectroscopy of the density of gap states in ETP-deposited a-Si:H. Journal of Non-Crystalline Solids, 338. 244-248 doi:10.1016/j.jnoncrysol.2004.02.078
Kessels, W.M.M, Severens, R.J, van de Sanden, M.C.M, Schram, D.C (1998) Temperature and growth-rate effects on the hydrogen incorporation in a-Si:H. Journal of Non-Crystalline Solids, 227. 133-137 doi:10.1016/s0022-3093(98)00028-3
Aarts, I.M.P., van de Sanden, M.C.M., Kessels, W.M.M. (2004) Analysis of a-Si:H subgap absorption spectra obtained from absolute cavity ringdown absorption spectroscopy using an empirical DOS model. Journal of Non-Crystalline Solids, 338. 408-411 doi:10.1016/j.jnoncrysol.2004.03.100
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Dewarrat, R, Robertson, J (2002) Binding and surface diffusion of SiH3 radicals on a growing a-Si:H surface. Journal of Non-Crystalline Solids, 299. 48-52 doi:10.1016/s0022-3093(01)00994-2
 
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