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Rezek, B., Mates, T., Šı́pek, E., Stuchlı́k, J., Fejfar, A., Kočka, J. (2002) Influence of combined AFM/current measurement on local electronic properties of silicon thin films. Journal of Non-Crystalline Solids, 299. 360-364 doi:10.1016/s0022-3093(01)01012-2

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Reference TypeJournal (article/letter/editorial)
TitleInfluence of combined AFM/current measurement on local electronic properties of silicon thin films
JournalJournal of Non-Crystalline Solids
AuthorsRezek, B.Author
Mates, T.Author
Šı́pek, E.Author
Stuchlı́k, J.Author
Fejfar, A.Author
Kočka, J.Author
Year2002 (April)Volume299
PublisherElsevier BV
DOIdoi:10.1016/s0022-3093(01)01012-2Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID640191Long-form Identifiermindat:1:5:640191:1
GUID0
Full ReferenceRezek, B., Mates, T., Šı́pek, E., Stuchlı́k, J., Fejfar, A., Kočka, J. (2002) Influence of combined AFM/current measurement on local electronic properties of silicon thin films. Journal of Non-Crystalline Solids, 299. 360-364 doi:10.1016/s0022-3093(01)01012-2
Plain TextRezek, B., Mates, T., Šı́pek, E., Stuchlı́k, J., Fejfar, A., Kočka, J. (2002) Influence of combined AFM/current measurement on local electronic properties of silicon thin films. Journal of Non-Crystalline Solids, 299. 360-364 doi:10.1016/s0022-3093(01)01012-2
In(2002) Journal of Non-Crystalline Solids Vol. 299. Elsevier BV

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Kočka, J., Stuchlı́ková, H., Stuchlı́k, J., Rezek, B., Mates, T., Švrček, V., Fojtı́k, P., Pelant, I., Fejfar, A. (2002) Model of transport in microcrystalline silicon. Journal of Non-Crystalline Solids, 299. 355-359 doi:10.1016/s0022-3093(02)00931-6
Fejfar, A, Rezek, B, Knápek, P, Stuchlı́k, J, Kočka, J (2000) Local electronic transport in microcrystalline silicon observed by combined atomic force microscopy. Journal of Non-Crystalline Solids, 266. 309-314 doi:10.1016/s0022-3093(99)00841-8
Fejfar, A., Mates, T., Čertı́k, O., Rezek, B., Stuchlı́k, J., Pelant, I., Kočka, J. (2004) Model of electronic transport in microcrystalline silicon and its use for prediction of device performance. Journal of Non-Crystalline Solids, 338. 303-309 doi:10.1016/j.jnoncrysol.2004.02.063
Mates, T, Fejfar, A, Drbohlav, I, Rezek, B, Fojtı́k, P, Luterová, K, Kočka, J, Koch, C, Schubert, M.B, Ito, M, Ro, K, Uyama, H (2002) Role of grains in protocrystalline silicon layers grown at very low substrate temperatures and studied by atomic force microscopy. Journal of Non-Crystalline Solids, 299. 767-771 doi:10.1016/s0022-3093(01)00980-2
Rezek, B., Stuchlı́k, J., Fejfar, A., Kočka, J. (1999) Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution. Applied Physics Letters, 74 (10). 1475-1477 doi:10.1063/1.123585
Rezek, B., Stuchlı́k, J., Fejfar, A., Kočka, J. (2002) Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection. Journal of Applied Physics, 92 (1). 587-593 doi:10.1063/1.1486032
Švrček, V, Fejfar, A, Fojtı́k, P, Mates, T, Poruba, A, Stuchlı́ková, H, Pelant, I, Kočka, J, Nasuno, Y, Kondo, M, Matsuda, A (2002) Importance of the transport isotropy in μc-Si:H thin films for solar cells deposited at low substrate temperatures. Journal of Non-Crystalline Solids, 299. 395-399 doi:10.1016/s0022-3093(01)01014-6
Honda, S., Mates, T., Rezek, B., Fejfar, A., Kočka, J. (2008) Microscopic study of the H2O vapor treatment of the silicon grain boundaries. Journal of Non-Crystalline Solids, 354 (19) 2310-2313 doi:10.1016/j.jnoncrysol.2007.09.107
Mates, T., Bronsveld, P.C.P., Fejfar, A., Rezek, B., Kočka, J., Rath, J.K., Schropp, R.E.I. (2006) Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM. Journal of Non-Crystalline Solids, 352 (9) 1011-1015 doi:10.1016/j.jnoncrysol.2005.10.058
Rezek, B., Šípek, E., Ledinský, M., Krejza, P., Stuchlík, J., Fejfar, A., Kočka, J. (2008) Spatially localized current-induced crystallization of amorphous silicon films. Journal of Non-Crystalline Solids, 354 (19) 2305-2309 doi:10.1016/j.jnoncrysol.2007.10.045
Vetushka, A., Ledinský, M., Stuchlík, J., Mates, T., Fejfar, A., Kočka, J. (2008) Mapping of mechanical stress in silicon thin films on silicon cantilevers by Raman microspectroscopy. Journal of Non-Crystalline Solids, 354 (19) 2235-2237 doi:10.1016/j.jnoncrysol.2007.09.072
 
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