| Reference Type | Journal (article/letter/editorial) |
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| Title | Positron annihilation study of defects and microheterogeneity of chalcogenide glassy semiconductors |
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| Journal | Journal of Non-Crystalline Solids |
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| Authors | Shantarovich, V.P. | Author |
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| Kobrin, B.V. | Author |
| Year | 1987 (February) | Volume | 90 |
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| Issue | 1 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/s0022-3093(87)80448-9Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 627392 | Long-form Identifier | mindat:1:5:627392:1 |
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| GUID | 0 |
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| Full Reference | Shantarovich, V.P., Kobrin, B.V. (1987) Positron annihilation study of defects and microheterogeneity of chalcogenide glassy semiconductors. Journal of Non-Crystalline Solids, 90 (1) 393-396 doi:10.1016/s0022-3093(87)80448-9 |
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| Plain Text | Shantarovich, V.P., Kobrin, B.V. (1987) Positron annihilation study of defects and microheterogeneity of chalcogenide glassy semiconductors. Journal of Non-Crystalline Solids, 90 (1) 393-396 doi:10.1016/s0022-3093(87)80448-9 |
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| In | (1987, February) Journal of Non-Crystalline Solids Vol. 90 (1) Elsevier BV |
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