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Drozdov, M. N., Drozdov, Yu. N., Novikov, A. V., Yunin, P. A., Yurasov, D. V. (2018) A New Limitation of the Depth Resolution in TOF-SIMS Elemental Profiling: the Influence of a Probing Ion Beam. Technical Physics Letters, 44. 320-323 doi:10.1134/s1063785018040181

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Reference TypeJournal (article/letter/editorial)
TitleA New Limitation of the Depth Resolution in TOF-SIMS Elemental Profiling: the Influence of a Probing Ion Beam
JournalTechnical Physics Letters
AuthorsDrozdov, M. N.Author
Drozdov, Yu. N.Author
Novikov, A. V.Author
Yunin, P. A.Author
Yurasov, D. V.Author
Year2018 (April)Volume44
PublisherPleiades Publishing Ltd
DOIdoi:10.1134/s1063785018040181Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6209893Long-form Identifiermindat:1:5:6209893:7
GUID0
Full ReferenceDrozdov, M. N., Drozdov, Yu. N., Novikov, A. V., Yunin, P. A., Yurasov, D. V. (2018) A New Limitation of the Depth Resolution in TOF-SIMS Elemental Profiling: the Influence of a Probing Ion Beam. Technical Physics Letters, 44. 320-323 doi:10.1134/s1063785018040181
Plain TextDrozdov, M. N., Drozdov, Yu. N., Novikov, A. V., Yunin, P. A., Yurasov, D. V. (2018) A New Limitation of the Depth Resolution in TOF-SIMS Elemental Profiling: the Influence of a Probing Ion Beam. Technical Physics Letters, 44. 320-323 doi:10.1134/s1063785018040181
In(n.d.) Technical Physics Letters Vol. 44. Pleiades Publishing Ltd

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Drozdov, M. N., Drozdov, Yu. N., Novikov, A. V., Yunin, P. A., Yurasov, D. V. (2016) Nonlinear calibration curves in secondary ion mass spectrometry for quantitative analysis of gesi heterostructures with nanoclusters. Technical Physics Letters, 42. 243-247 doi:10.1134/s1063785016030044
Drozdov, M. N., Drozdov, Yu. N., Zakharov, N. D., Lobanov, D. N., Novikov, A. V., Yunin, P. A., Yurasov, D. V. (2014) A new approach to the diagnostics of nanoislands in Ge x Si1 − x /Si heterostructures by secondary ion mass spectrometry. Technical Physics Letters, 40. 601-605 doi:10.1134/s1063785014070190
Drozdov, M. N., Drozdov, Yu. N., Polkovnikov, V. N., Starikov, S. D., Yunin, P. A. (2013) A new alternative to secondary CsM+ ions for depth profiling of multilayer metal structures by secondary ion mass spectrometry. Technical Physics Letters, 39. 46-50 doi:10.1134/s1063785013010070
Yunin, P. A., Drozdov, Yu. N., Drozdov, M. N., Novikov, A. V., Yurasov, D. V., Zakharov, N. D., Korolev, S. A. (2014) Use of related parameters in X-ray diffraction analysis of multilayer structures with allowance for the layer growth time. Technical Physics, 59 (3). 402-406 doi:10.1134/s1063784214030293
Drozdov, M. N., Drozdov, Yu. N., Pakhomov, G. L., Travkin, V. V., Yunin, P. A., Razumov, V. F. (2013) Depth profiling of fullerene-containing structures by time-of-flight secondary ion mass spectrometry. Technical Physics Letters, 39. 1097-1100 doi:10.1134/s1063785013120183
Drozdov, M. N., Danil’tsev, V. M., Drozdov, Yu. N., Khrykin, O. I., Yunin, P. A. (2017) Selective analysis of the elemental composition of InGaAs/GaAs nanoclusters by secondary ion mass spectrometry. Technical Physics Letters, 43. 477-480 doi:10.1134/s1063785017050170
Masterov, D. V., Drozdov, M. N., Drozdov, Yu. N., Pavlov, S. A., Parafin, A. E., Yunin, P. A. (2013) Changes in the elemental composition and microstructure of an YBa2Cu3O7 − δ target during magnetron sputtering. Technical Physics Letters, 39. 862-865 doi:10.1134/s1063785013100076
Drozdov, M. N., Drozdov, Yu. N., Lobaev, M. A., Yunin, P. A. (2018) New Cluster Secondary Ions for Quantitative Analysis of the Concentration of Boron Atoms in Diamond by Time-of-Flight Secondary-Ion Mass Spectrometry. Technical Physics Letters, 44. 297-300 doi:10.1134/s106378501804003x
Drozdov, M. N., Drozdov, Yu. N., Okhapkin, A. I., Kraev, S. A., Lobaev, M. V. (2019) A New Approach to TOF-SIMS Analysis of the Phase Composition of Carbon-Containing Materials. Technical Physics Letters, 45. 48-52 doi:10.1134/s1063785019010231
Yurasov, D. V., Drozdov, M. N., Murel’, A. V., Novikov, A. V. (2011) Method of selective doping of silicon by segregating impurities. Technical Physics Letters, 37. 824-826 doi:10.1134/s106378501109015x
Drozdov, M. N., Danil’tsev, V. M., Drozdov, Yu. N., Khrykin, O. I., Shashkin, V. I. (2001) Subnanometer resolution in depth profiling using glancing Auger electrons. Technical Physics Letters, 27. 114-117 doi:10.1134/1.1352765
 
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