Timoshenko, V. Yu. (2005) Erbium Ion Luminescence of Silicon Nanocrystal Layers in a Silicon Dioxide Matrix Measured under Strong Optical Excitation. Physics of the Solid State, 47. 121pp. doi:10.1134/1.1853460
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Erbium Ion Luminescence of Silicon Nanocrystal Layers in a Silicon Dioxide Matrix Measured under Strong Optical Excitation | ||
| Journal | Physics of the Solid State | ||
| Authors | Timoshenko, V. Yu. | Author | |
| Year | 2005 | Volume | 47 |
| Publisher | Pleiades Publishing Ltd | ||
| DOI | doi:10.1134/1.1853460Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6152011 | Long-form Identifier | mindat:1:5:6152011:0 |
| GUID | 0 | ||
| Full Reference | Timoshenko, V. Yu. (2005) Erbium Ion Luminescence of Silicon Nanocrystal Layers in a Silicon Dioxide Matrix Measured under Strong Optical Excitation. Physics of the Solid State, 47. 121pp. doi:10.1134/1.1853460 | ||
| Plain Text | Timoshenko, V. Yu. (2005) Erbium Ion Luminescence of Silicon Nanocrystal Layers in a Silicon Dioxide Matrix Measured under Strong Optical Excitation. Physics of the Solid State, 47. 121pp. doi:10.1134/1.1853460 | ||
| In | (n.d.) Physics of the Solid State Vol. 47. Pleiades Publishing Ltd | ||
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