Ikeuchi, J., Hamamatsu, H., Miyamoto, T., Tanaka, S., Yamashita, Y., Yoshikawa, H., Ueda, S. (2015) Electronic structure of the polymer-cathode interface of an organic electroluminescent device investigated using operando hard x-ray photoelectron spectroscopy. Journal of Applied Physics, 118 (8). 85308pp. doi:10.1063/1.4929448

See Also

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	Mori, T., Fujikawa, H., Tokito, S., Taga, Y. (1998) Electronic structure of 8-hydroxyquinoline aluminum/LiF/Al interface for organic electroluminescent device studied by ultraviolet photoelectron spectroscopy. Applied Physics Letters, 73 (19). 2763-2765 doi:10.1063/1.122583
	Nagata, T., Oh, S., Yamashita, Y., Yoshikawa, H., Hayakawa, R., Kobayashi, K., Chikyow, T., Wakayama, Y. (2012) Hard x-ray photoelectron spectroscopy study on band alignment at poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate)/ZnO interface. Applied Physics Letters, 101 (17). 173303pp. doi:10.1063/1.4762834
	Yamashita, Y., Yoshikawa, H., Chikyo, T., Kobayashi, K. (2014) Direct observation of bias-dependence potential distribution in metal/HfO2 gate stack structures by hard x-ray photoelectron spectroscopy under device operation. Journal of Applied Physics, 115 (4). 43721pp. doi:10.1063/1.4863637
	Nagata, T., Oh, S., Yamashita, Y., Yoshikawa, H., Ikeno, N., Kobayashi, K., Chikyow, T., Wakayama, Y. (2013) Photoelectron spectroscopic study of band alignment of polymer/ZnO photovoltaic device structure. Applied Physics Letters, 102 (4). 43302pp. doi:10.1063/1.4790298
	Nagata, T., Haemori, M., Yamashita, Y., Yoshikawa, H., Iwashita, Y., Kobayashi, K., Chikyow, T. (2011) Bias application hard x-ray photoelectron spectroscopy study of forming process of Cu/HfO2/Pt resistive random access memory structure. Applied Physics Letters, 99 (22). 223517pp. doi:10.1063/1.3664781
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