| Reference Type | Journal (article/letter/editorial) |
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| Title | Characterization of carrier transport properties in strained crystalline Si wall-like structures in the quasi-quantum regime |
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| Journal | Journal of Applied Physics |
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| Authors | Mayberry, C. S. | Author |
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| Huang, Danhong | Author |
| Balakrishnan, G. | Author |
| Kouhestani, C. | Author |
| Islam, N. | Author |
| Brueck, S. R. J. | Author |
| Sharma, A. K. | Author |
| Year | 2015 (October 7) | Volume | 118 |
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| Issue | 13 |
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| Publisher | AIP Publishing |
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| DOI | doi:10.1063/1.4931151Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 5202772 | Long-form Identifier | mindat:1:5:5202772:7 |
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|
| GUID | 0 |
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| Full Reference | Mayberry, C. S., Huang, Danhong, Balakrishnan, G., Kouhestani, C., Islam, N., Brueck, S. R. J., Sharma, A. K. (2015) Characterization of carrier transport properties in strained crystalline Si wall-like structures in the quasi-quantum regime. Journal of Applied Physics, 118 (13). 134301pp. doi:10.1063/1.4931151 |
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| Plain Text | Mayberry, C. S., Huang, Danhong, Balakrishnan, G., Kouhestani, C., Islam, N., Brueck, S. R. J., Sharma, A. K. (2015) Characterization of carrier transport properties in strained crystalline Si wall-like structures in the quasi-quantum regime. Journal of Applied Physics, 118 (13). 134301pp. doi:10.1063/1.4931151 |
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| In | (2015, October) Journal of Applied Physics Vol. 118 (13) AIP Publishing |
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