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Jameson, John R., Harrison, Walter, Griffin, P. B. (2002) Electronic susceptibility in thin films and interfaces. Journal of Applied Physics, 92 (8). 4431-4440 doi:10.1063/1.1507812

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Reference TypeJournal (article/letter/editorial)
TitleElectronic susceptibility in thin films and interfaces
JournalJournal of Applied Physics
AuthorsJameson, John R.Author
Harrison, WalterAuthor
Griffin, P. B.Author
Year2002 (October 15)Volume92
Issue8
PublisherAIP Publishing
DOIdoi:10.1063/1.1507812Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5117112Long-form Identifiermindat:1:5:5117112:8
GUID0
Full ReferenceJameson, John R., Harrison, Walter, Griffin, P. B. (2002) Electronic susceptibility in thin films and interfaces. Journal of Applied Physics, 92 (8). 4431-4440 doi:10.1063/1.1507812
Plain TextJameson, John R., Harrison, Walter, Griffin, P. B. (2002) Electronic susceptibility in thin films and interfaces. Journal of Applied Physics, 92 (8). 4431-4440 doi:10.1063/1.1507812
In(2002, October) Journal of Applied Physics Vol. 92 (8) AIP Publishing

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Jameson, John R., Harrison, Walter, Griffin, P. B. (2001) Tight-binding model and electronic structure of tetrahedral zirconium silicate. Journal of Applied Physics, 90 (9). 4570-4577 doi:10.1063/1.1406972
Jameson, John R., Harrison, Walter, Griffin, P. B., Plummer, J. D., Nishi, Y. (2006) A semiclassical model of dielectric relaxation in glasses. Journal of Applied Physics, 100 (12). 124104pp. doi:10.1063/1.2397323
Jameson, John R., Harrison, Walter, Griffin, P. B., Plummer, J. D. (2004) Double-well model of dielectric relaxation current. Applied Physics Letters, 84 (18). 3489-3491 doi:10.1063/1.1738177
Apblett, C., Ficalora, P. J. (1991) Stress generation in thin Cu‐Ti films in vacuum and hydrogen. Journal of Applied Physics, 69 (8). 4431-4432 doi:10.1063/1.348370
Tsunoda, K., Fukuzumi, Y., Jameson, J. R., Wang, Z., Griffin, P. B., Nishi, Y. (2007) Bipolar resistive switching in polycrystalline TiO2 films. Applied Physics Letters, 90 (11). 113501pp. doi:10.1063/1.2712777
Jin, H. Z., Zhu, Jing (2002) Size effect and fatigue mechanism in ferroelectric thin films. Journal of Applied Physics, 92 (8). 4594-4598 doi:10.1063/1.1506193
Gonon, P., Sylvestre, A. (2002) Dielectric properties of fluorocarbon thin films deposited by radio frequency sputtering of polytetrafluoroethylene. Journal of Applied Physics, 92 (8). 4584-4589 doi:10.1063/1.1505983
Curry, R. J., Gillin, W. P., Clarkson, J., Batchelder, D. N. (2002) Morphological study of aluminumtris(8-hydroxyquinoline) thin films using infrared and Raman spectroscopy. Journal of Applied Physics, 92 (4). 1902-1905 doi:10.1063/1.1495527
Venkatakrishnan, K., Tan, B., Stanley, P., Sivakumar, N. R. (2002) The effect of polarization on ultrashort pulsed laser ablation of thin metal films. Journal of Applied Physics, 92 (3). 1604-1607 doi:10.1063/1.1487453
Lewis, J. S., Davidson, M. R., Holloway, P. H. (2002) Control of point defects and space charge in electroluminescent ZnS:Mn thin films. Journal of Applied Physics, 92 (11). 6646-6657 doi:10.1063/1.1516625
Griffin, A. J., Brotzen, F. R., Loos, P. J. (1994) Effect of thickness on the transverse thermal conductivity of thin dielectric films. Journal of Applied Physics, 75 (8). 3761-3764 doi:10.1063/1.356049
 
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