Alessandrini, A., Valdrè, G., Morten, B., Prudenziati, M. (2002) Electric force microscopy investigation of the microstructure of thick film resistors. Journal of Applied Physics, 92 (8). 4705-4711 doi:10.1063/1.1506188
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Electric force microscopy investigation of the microstructure of thick film resistors | ||
| Journal | Journal of Applied Physics | ||
| Authors | Alessandrini, A. | Author | |
| Valdrè, G. | Author | ||
| Morten, B. | Author | ||
| Prudenziati, M. | Author | ||
| Year | 2002 (October 15) | Volume | 92 |
| Issue | 8 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.1506188Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5117063 | Long-form Identifier | mindat:1:5:5117063:3 |
| GUID | 0 | ||
| Full Reference | Alessandrini, A., Valdrè, G., Morten, B., Prudenziati, M. (2002) Electric force microscopy investigation of the microstructure of thick film resistors. Journal of Applied Physics, 92 (8). 4705-4711 doi:10.1063/1.1506188 | ||
| Plain Text | Alessandrini, A., Valdrè, G., Morten, B., Prudenziati, M. (2002) Electric force microscopy investigation of the microstructure of thick film resistors. Journal of Applied Physics, 92 (8). 4705-4711 doi:10.1063/1.1506188 | ||
| In | (2002, October) Journal of Applied Physics Vol. 92 (8) AIP Publishing | ||
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