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Harris, J. L., Bryce, A. C., Kowalski, O. P., Marsh, J. H. (2006) 1.3 µm single-mode extended cavity GaInNAs lasers produced using a sputtered SiO2 quantum well intermixing technique. physica status solidi (c), 3 (3). 399-402 doi:10.1002/pssc.200564149

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Reference TypeJournal (article/letter/editorial)
Title1.3 µm single-mode extended cavity GaInNAs lasers produced using a sputtered SiO2 quantum well intermixing technique
Journalphysica status solidi (c)
AuthorsHarris, J. L.Author
Bryce, A. C.Author
Kowalski, O. P.Author
Marsh, J. H.Author
Year2006 (March)Volume3
Issue3
PublisherWiley
DOIdoi:10.1002/pssc.200564149Search in ResearchGate
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Mindat Ref. ID5111609Long-form Identifiermindat:1:5:5111609:7
GUID0
Full ReferenceHarris, J. L., Bryce, A. C., Kowalski, O. P., Marsh, J. H. (2006) 1.3 µm single-mode extended cavity GaInNAs lasers produced using a sputtered SiO2 quantum well intermixing technique. physica status solidi (c), 3 (3). 399-402 doi:10.1002/pssc.200564149
Plain TextHarris, J. L., Bryce, A. C., Kowalski, O. P., Marsh, J. H. (2006) 1.3 µm single-mode extended cavity GaInNAs lasers produced using a sputtered SiO2 quantum well intermixing technique. physica status solidi (c), 3 (3). 399-402 doi:10.1002/pssc.200564149
In(2006, March) physica status solidi (c) Vol. 3 (3) Wiley

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Hulko, O., Thompson, D.A., Simmons, J. G. (2006) Quantitative compositional analysis of quantum well intermixing using a low temperature MBE-grown InP cap layer. physica status solidi (c), 3 (3). 647-650 doi:10.1002/pssc.200564109
Sun, H. D., Macaluso, R., Dawson, M. D., Robert, F., Bryce, A. C., Marsh, J. H., Riechert, H. (2003) Characterization of selective quantum well intermixing in 1.3 μm GaInNAs/GaAs structures. Journal of Applied Physics, 94 (3). 1550-1556 doi:10.1063/1.1590413
Qiu, Bocang, Hamilton, Craig J., Ke, Maolong, Kowalski, Olek P., McDougall, Stewart D., Bryce, A. Catrina, Marsh, John H. (1999) Extended Cavity Lasers in InGaAs-InGaAsP and GaInP-AlGaInP Multi-Quantum Well Structure Using a Sputtered SiO2Technique. Japanese Journal of Applied Physics, 38. 1246-1248 doi:10.1143/jjap.38.1246
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