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Imhof, Joseph M., Kwak, Eun-Soo, Vanden Bout, David A. (2003) Standard sample probes for characterizing optical apertures in near-field scanning optical microscopy. Review of Scientific Instruments, 74 (4). 2424-2428 doi:10.1063/1.1556951

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Reference TypeJournal (article/letter/editorial)
TitleStandard sample probes for characterizing optical apertures in near-field scanning optical microscopy
JournalReview of Scientific Instruments
AuthorsImhof, Joseph M.Author
Kwak, Eun-SooAuthor
Vanden Bout, David A.Author
Year2003 (April)Volume74
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/1.1556951Search in ResearchGate
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Mindat Ref. ID4889751Long-form Identifiermindat:1:5:4889751:8
GUID0
Full ReferenceImhof, Joseph M., Kwak, Eun-Soo, Vanden Bout, David A. (2003) Standard sample probes for characterizing optical apertures in near-field scanning optical microscopy. Review of Scientific Instruments, 74 (4). 2424-2428 doi:10.1063/1.1556951
Plain TextImhof, Joseph M., Kwak, Eun-Soo, Vanden Bout, David A. (2003) Standard sample probes for characterizing optical apertures in near-field scanning optical microscopy. Review of Scientific Instruments, 74 (4). 2424-2428 doi:10.1063/1.1556951
In(2003, April) Review of Scientific Instruments Vol. 74 (4) AIP Publishing

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Hoshino, Kazunori, Rozanski, Lynn J., Vanden Bout, David A., Zhang, Xiaojing (2008) Near-field scanning optical microscopy with monolithic silicon light emitting diode on probe tip. Applied Physics Letters, 92 (13). 131106pp. doi:10.1063/1.2904698
Muramatsu, H., Kim, J. M., Sugiyama, S., Ohtani, T. (2003) Simultaneous multicolor fluorescence imaging by scanning near-field optical/atomic force microscopy. Review of Scientific Instruments, 74 (1). 100-103 doi:10.1063/1.1529304
Higgins, Daniel A., Vanden Bout, David A., Kerimo, Josef, Barbara, Paul F. (1996) Polarization-Modulation Near-Field Scanning Optical Microscopy of Mesostructured Materials. The Journal of Physical Chemistry, 100 (32). 13794-13803 doi:10.1021/jp9609951
Biehler, B., La Rosa, A. H. (2002) High frequency-bandwidth optical technique to measure thermal elongation time responses of near-field scanning optical microscopy probes. Review of Scientific Instruments, 73 (11). 3837-3840 doi:10.1063/1.1510548
 
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